@article{ART002895554},
author={baikjaewook},
title={Reliability analysis methods to one-shot device},
journal={Industry Promotion Research},
issn={2466-1139},
year={2022},
volume={7},
number={4},
pages={1-8},
doi={10.21186/IPR.2022.7.4.001}

TY - JOUR
AU - baikjaewook
TI - Reliability analysis methods to one-shot device
JO - Industry Promotion Research
PY - 2022
VL - 7
IS - 4
PB - Industrial Promotion Institute
SP - 1
EP - 8
SN - 2466-1139
AB - There are many one-shot devices that are used once and thrown away. One-shot devices such as firecrackers and ammunition are typical, and they are stored for a while after manufacture and then disposed of after use when necessary. However, unlike general operating systems, these one-shot devices have not been properly evaluated. This study first examines what the government does to secure reliability in the case of ammunition through ammunition stockpile reliability program. Next, in terms of statistical analysis, we show what the reliability analysis methods are for one-shot devices such as ammunition. Specifically, we show that it is possible to know the level of reliability if sampling inspection plan such as KS Q 0001 which is acceptance sampling plan by attributes is used. Next, non-parametric and parametric methods are introduced as ways to determine the storage reliability of ammunition. Among non-parametric methods, Kaplan-Meier method can be used since it can also handle censored data. Among parametric methods, Weibull distribution can be used to determine the storage reliability of ammunition.
KW - One-shot device;Reliability analysis;Ammunition stockpile reliability program;Non-parametric method;Parametric method
DO - 10.21186/IPR.2022.7.4.001
ER -

baikjaewook. (2022). Reliability analysis methods to one-shot device. Industry Promotion Research, 7(4), 1-8.

baikjaewook. 2022, "Reliability analysis methods to one-shot device", Industry Promotion Research, vol.7, no.4 pp.1-8. Available from: doi:10.21186/IPR.2022.7.4.001

baikjaewook "Reliability analysis methods to one-shot device" Industry Promotion Research 7.4 pp.1-8 (2022) : 1.

baikjaewook. Reliability analysis methods to one-shot device. 2022; 7(4), 1-8. Available from: doi:10.21186/IPR.2022.7.4.001

baikjaewook. "Reliability analysis methods to one-shot device" Industry Promotion Research 7, no.4 (2022) : 1-8.doi: 10.21186/IPR.2022.7.4.001

baikjaewook. Reliability analysis methods to one-shot device. Industry Promotion Research, 7(4), 1-8. doi: 10.21186/IPR.2022.7.4.001

baikjaewook. Reliability analysis methods to one-shot device. Industry Promotion Research. 2022; 7(4) 1-8. doi: 10.21186/IPR.2022.7.4.001

baikjaewook. Reliability analysis methods to one-shot device. 2022; 7(4), 1-8. Available from: doi:10.21186/IPR.2022.7.4.001

baikjaewook. "Reliability analysis methods to one-shot device" Industry Promotion Research 7, no.4 (2022) : 1-8.doi: 10.21186/IPR.2022.7.4.001