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Analysis of Potential Risks for Garbage Collection and Wear Leveling Interference in FTL-based NAND Flash Memory

Journal of The Korea Society of Computer and Information
Abbr : JKSCI
2019, 24(3), pp.1-9
DOI :https://doi.org/10.9708/jksci.2019.24.03.001
Publisher : The Korean Society Of Computer And Information
Research Area : Computer Science

Kim Sungho 1 Kwak, Jong Wook 2

1 영남대학교
2 영남대학교

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