In this paper, we introduce a technique for generating synthetic benchmarks based on time series data. Many of the data measured on IoT devices have a time series characteristic that measures numerical changes over time. However, there is a problem that it is difficult to model the data measured over a long period as generalized time series data. To solve this problem, this paper introduces the BST-IGT model. The BST-IGT model separates the entire data into sections that can be easily time-series modeled, collects the generated data into templates, and produces new synthetic benchmarks that share or modify characteristics based on them. As a result of making a new benchmark using the proposed modeling method, we could create a benchmark with multiple aspects by mixing the composite benchmark with the statistical features of the existing data and other benchmarks.