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pISSN : 1229-0033 / eISSN : 2234-036X

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A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform

Textile Coloration and Finishing
Abbr : Text. Color. and Finish.
2009, 21(1), pp.53-58
Publisher : The Korean Society Of Dyers And Finishers
Research Area : Dyeing Engineering

김경준 1 이창환 2 Jooyong Kim 3

1숭실대학교
2숭실대학교
3숭실대학교

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