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A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform

  • Textile Coloration and Finishing
  • Abbr : Text. Color. and Finish.
  • 2009, 21(1), pp.53-58
  • Publisher : The Korean Society Of Dyers And Finishers
  • Research Area : Engineering > Fiber Engineering > Dyeing Engineering

김경준 1 이창환 1 Jooyong Kim 1

1숭실대학교

Accredited

ABSTRACT

A real-time inspection system has been developed by combining CCD based image processing algorithm and a standard lighting equipment. The system was tested for defective fabrics showing nozzle contact scratch marks, which were one of the frequently occurring defects. Multi-resolution analysis(MRA) algorithm were used and evaluated according to both their processing time and detection rate. Standard value for defective inspection was the mean of the non-defect image feature. Similarity was decided via comparing standard value with sample image feature value. Totally, we achieved defective inspection accuracy above 95%.

Citation status

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