@article{ART001319682},
author={김경준 and 이창환 and Jooyong Kim},
title={A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform},
journal={Textile Coloration and Finishing },
issn={1229-0033},
year={2009},
volume={21},
number={1},
pages={53-58}
TY - JOUR
AU - 김경준
AU - 이창환
AU - Jooyong Kim
TI - A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform
JO - Textile Coloration and Finishing
PY - 2009
VL - 21
IS - 1
PB - The Korean Society Of Dyers And Finishers
SP - 53
EP - 58
SN - 1229-0033
AB - A real-time inspection system has been developed by combining CCD based image processing algorithm and a standard lighting equipment. The system was tested for defective fabrics showing nozzle contact scratch marks, which were one of the frequently occurring defects. Multi-resolution analysis(MRA) algorithm were used and evaluated according to both their processing time and detection rate. Standard value for defective inspection was the mean of the non-defect image feature. Similarity was decided via comparing standard value with sample image feature value. Totally, we achieved defective inspection accuracy above 95%.
KW - Digital Textile Printing(DTP);inspection system;real-time image processing;multi-resolution analysis
DO -
UR -
ER -
김경준, 이창환 and Jooyong Kim. (2009). A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform. Textile Coloration and Finishing , 21(1), 53-58.
김경준, 이창환 and Jooyong Kim. 2009, "A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform", Textile Coloration and Finishing , vol.21, no.1 pp.53-58.
김경준, 이창환, Jooyong Kim "A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform" Textile Coloration and Finishing 21.1 pp.53-58 (2009) : 53.
김경준, 이창환, Jooyong Kim. A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform. 2009; 21(1), 53-58.
김경준, 이창환 and Jooyong Kim. "A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform" Textile Coloration and Finishing 21, no.1 (2009) : 53-58.
김경준; 이창환; Jooyong Kim. A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform. Textile Coloration and Finishing , 21(1), 53-58.
김경준; 이창환; Jooyong Kim. A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform. Textile Coloration and Finishing . 2009; 21(1) 53-58.
김경준, 이창환, Jooyong Kim. A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform. 2009; 21(1), 53-58.
김경준, 이창환 and Jooyong Kim. "A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform" Textile Coloration and Finishing 21, no.1 (2009) : 53-58.
