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@article{ART002478978},
author={Kwon, Ki Tae and Na-Young Lee},
title={Defect Severity-based Dimension Reduction Model using PCA},
journal={Journal of Software Assessment and Valuation},
issn={2092-8114},
year={2019},
volume={15},
number={1},
pages={79-86},
doi={10.29056/jsav.2019.06.09}

TY - JOUR
AU - Kwon, Ki Tae
AU - Na-Young Lee
TI - Defect Severity-based Dimension Reduction Model using PCA
JO - Journal of Software Assessment and Valuation
PY - 2019
VL - 15
IS - 1
PB - Korea Software Assessment and Valuation Society
SP - 79
EP - 86
SN - 2092-8114
AB - Software dimension reduction identifies the commonality of elements and extracts important feature elements. So it reduces complexity by simplify and solves multi-collinearity problems. And it reduces redundancy by performing redundancy and noise detection. In this study, we proposed defect severity-based dimension reduction model. Proposed model is applied defect severity-based NASA dataset. And it is verified the number of dimensions in the column that affect the severity of the defect. Then it is compares and analyzes the dimensions of the data before and after reduction. In this study experiment result, the number of dimensions of PC4's dataset is 2 to 3. It was possible to reduce the dimension.
KW - software quality;defect severity;PCA;association analysis;dimension reduction
DO - 10.29056/jsav.2019.06.09
ER -

Kwon, Ki Tae and Na-Young Lee. (2019). Defect Severity-based Dimension Reduction Model using PCA. Journal of Software Assessment and Valuation, 15(1), 79-86.

Kwon, Ki Tae and Na-Young Lee. 2019, "Defect Severity-based Dimension Reduction Model using PCA", Journal of Software Assessment and Valuation, vol.15, no.1 pp.79-86. Available from: doi:10.29056/jsav.2019.06.09

Kwon, Ki Tae, Na-Young Lee "Defect Severity-based Dimension Reduction Model using PCA" Journal of Software Assessment and Valuation 15.1 pp.79-86 (2019) : 79.

Kwon, Ki Tae, Na-Young Lee. Defect Severity-based Dimension Reduction Model using PCA. 2019; 15(1), 79-86. Available from: doi:10.29056/jsav.2019.06.09

Kwon, Ki Tae and Na-Young Lee. "Defect Severity-based Dimension Reduction Model using PCA" Journal of Software Assessment and Valuation 15, no.1 (2019) : 79-86.doi: 10.29056/jsav.2019.06.09

Kwon, Ki Tae; Na-Young Lee. Defect Severity-based Dimension Reduction Model using PCA. Journal of Software Assessment and Valuation, 15(1), 79-86. doi: 10.29056/jsav.2019.06.09

Kwon, Ki Tae; Na-Young Lee. Defect Severity-based Dimension Reduction Model using PCA. Journal of Software Assessment and Valuation. 2019; 15(1) 79-86. doi: 10.29056/jsav.2019.06.09

Kwon, Ki Tae, Na-Young Lee. Defect Severity-based Dimension Reduction Model using PCA. 2019; 15(1), 79-86. Available from: doi:10.29056/jsav.2019.06.09

Kwon, Ki Tae and Na-Young Lee. "Defect Severity-based Dimension Reduction Model using PCA" Journal of Software Assessment and Valuation 15, no.1 (2019) : 79-86.doi: 10.29056/jsav.2019.06.09