@article{ART002479007},
author={Moonjung Kim},
title={Analysis of Electrical Performance on Probe Pin},
journal={Journal of Software Assessment and Valuation},
issn={2092-8114},
year={2019},
volume={15},
number={1},
pages={109-114},
doi={10.29056/jsav.2019.06.13}
TY - JOUR
AU - Moonjung Kim
TI - Analysis of Electrical Performance on Probe Pin
JO - Journal of Software Assessment and Valuation
PY - 2019
VL - 15
IS - 1
PB - Korea Software Assessment and Valuation Society
SP - 109
EP - 114
SN - 2092-8114
AB - In this paper, simulations of S-parameter and characteristic impedance for the probe pin are performed and its high-frequency performance is analyzed. The probe pins are arranged with one signal pin in the center and four ground pins on the top, bottom, left and right sides. The insertion loss and return loss of the probe pin are calculated while increasing the separation between the probe pins to 0.35 mm, 0.40 mm, and 0.50 mm, respectively. It is confirmed that the probe pin has different features of the insertion loss due to its periodic resonance phenomenon. Effect of the characteristic impedance on pitch and assignment of the probe pin is also analyzed. It is verified that there are a number of ground pins whose characteristic impedance is close to 50 Ω.
KW - probe pin;pitch;characteristic impedance;high-frequency;insertion loss;reflection loss
DO - 10.29056/jsav.2019.06.13
ER -
Moonjung Kim. (2019). Analysis of Electrical Performance on Probe Pin. Journal of Software Assessment and Valuation, 15(1), 109-114.
Moonjung Kim. 2019, "Analysis of Electrical Performance on Probe Pin", Journal of Software Assessment and Valuation, vol.15, no.1 pp.109-114. Available from: doi:10.29056/jsav.2019.06.13
Moonjung Kim "Analysis of Electrical Performance on Probe Pin" Journal of Software Assessment and Valuation 15.1 pp.109-114 (2019) : 109.
Moonjung Kim. Analysis of Electrical Performance on Probe Pin. 2019; 15(1), 109-114. Available from: doi:10.29056/jsav.2019.06.13
Moonjung Kim. "Analysis of Electrical Performance on Probe Pin" Journal of Software Assessment and Valuation 15, no.1 (2019) : 109-114.doi: 10.29056/jsav.2019.06.13
Moonjung Kim. Analysis of Electrical Performance on Probe Pin. Journal of Software Assessment and Valuation, 15(1), 109-114. doi: 10.29056/jsav.2019.06.13
Moonjung Kim. Analysis of Electrical Performance on Probe Pin. Journal of Software Assessment and Valuation. 2019; 15(1) 109-114. doi: 10.29056/jsav.2019.06.13
Moonjung Kim. Analysis of Electrical Performance on Probe Pin. 2019; 15(1), 109-114. Available from: doi:10.29056/jsav.2019.06.13
Moonjung Kim. "Analysis of Electrical Performance on Probe Pin" Journal of Software Assessment and Valuation 15, no.1 (2019) : 109-114.doi: 10.29056/jsav.2019.06.13
