@article{ART001112751},
author={진광수 and Park, Hyo-Yeol and 조재혁},
title={Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry},
journal={Journal of the Korean Crystal Growth and Crystal Technology},
issn={1225-1429},
year={2005},
volume={15},
number={4},
pages={157-161}
TY - JOUR
AU - 진광수
AU - Park, Hyo-Yeol
AU - 조재혁
TI - Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry
JO - Journal of the Korean Crystal Growth and Crystal Technology
PY - 2005
VL - 15
IS - 4
PB - The Korea Association Of Crystal Growth, Inc.
SP - 157
EP - 161
SN - 1225-1429
AB - Spectroscopic ellipsomerty measurements of the complex dielectric function of the CdTe thin films grown on GaAs(100) substrates by hot wall epitaxy have been performed in 1.5~5.5eV photon energy range at room temperature. The spectroscopic ellipsometer spectra revealed distinct structures at energies of the E1, E1 + D1, and E2 critical points. These energies were decreased with increasing thickness of CdTe thin films.
KW - CdTe thin film;Spectroscopic ellipsomerty;Dielectric function
DO -
UR -
ER -
진광수, Park, Hyo-Yeol and 조재혁. (2005). Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry. Journal of the Korean Crystal Growth and Crystal Technology, 15(4), 157-161.
진광수, Park, Hyo-Yeol and 조재혁. 2005, "Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry", Journal of the Korean Crystal Growth and Crystal Technology, vol.15, no.4 pp.157-161.
진광수, Park, Hyo-Yeol, 조재혁 "Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry" Journal of the Korean Crystal Growth and Crystal Technology 15.4 pp.157-161 (2005) : 157.
진광수, Park, Hyo-Yeol, 조재혁. Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry. 2005; 15(4), 157-161.
진광수, Park, Hyo-Yeol and 조재혁. "Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry" Journal of the Korean Crystal Growth and Crystal Technology 15, no.4 (2005) : 157-161.
진광수; Park, Hyo-Yeol; 조재혁. Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry. Journal of the Korean Crystal Growth and Crystal Technology, 15(4), 157-161.
진광수; Park, Hyo-Yeol; 조재혁. Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry. Journal of the Korean Crystal Growth and Crystal Technology. 2005; 15(4) 157-161.
진광수, Park, Hyo-Yeol, 조재혁. Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry. 2005; 15(4), 157-161.
진광수, Park, Hyo-Yeol and 조재혁. "Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry" Journal of the Korean Crystal Growth and Crystal Technology 15, no.4 (2005) : 157-161.
