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Characterizations of CuInGaSe(CIGS) mixed-source and the thin film

  • Journal of the Korean Crystal Growth and Crystal Technology
  • Abbr : J. Korean Cryst. Growth Cryst. Technol.
  • 2010, 20(1), pp.1-6
  • Publisher : The Korea Association Of Crystal Growth, Inc.
  • Research Area : Engineering > Materials Science and Engineering

이아름 1 Hunsoo Jeon 1 Gang Seok Lee 1 옥진은 1 조동완 1 Kyoung Hwa Kim 1 Min Yang 1 이삼녕 ORD ID 1 Hyung Soo Ahn 1 Cho, Chae-Ryong 2 SOHN Sang Ho 3 Hong Ju Ha 4

1한국해양대학교
2부산대학교
3경북대학교
4시스솔루션

Accredited

ABSTRACT

CuInGaSe(CIGS) mixed-source was prepared by hydride vapor phase epitaxy (HVPE). Each metal was mixed in regular ratio and soaked at 1090oC for 90 minutes in nitrogen atmosphere. After making the mixed-source to powder state,the pellet was made by the powder. The diameter of pellet is 10 mm. The CIGS thin film was deposited on soda lime glass evaporated Mo layer by e-beam evaporator. To confirm the crystallization, we measured X-ray diffraction (XRD). High intensity X-ray peaks diffracted from (112), (204)/(220), (116)/(312) and (400) of CIGS thin film and from (110) of Mo were confirmed by XRD measurement.

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