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Fabrication and characterization of GaN substrate by HVPE

  • Journal of the Korean Crystal Growth and Crystal Technology
  • Abbr : J. Korean Cryst. Growth Cryst. Technol.
  • 2010, 20(4), pp.164~167
  • Publisher : The Korea Association Of Crystal Growth, Inc.
  • Research Area : Engineering > Materials Science and Engineering

오동근 1,  Bonggeun Choi 1,  방신영 1,  은종원 1,  정준호 1,  이성국 1,  정진현 2,  Kwang Bo Shim 1

1한양대학교
2유니모테크놀로지

Accredited

ABSTRACT

Bulk GaN single crystal with 1.5 mm thickness was successfully grown by hydride vapor phase epitaxy (HVPE)technique. Free-standing GaN substrates of 10 × 10, 15 × 15 mm size were fabricate after lift-off of sapphire substrate and their optical properties were characterized properties for device applications. X-ray diffraction patterns showed (002) and (004) peak, and the FWHM of the X-ray rocking curve (XRC) measurement in (002) was 98 arcsec. A sharp photoluminescence spectrum at 363 nm was observed and defect spectrum at visible range was not detected. The hexagonal-shaped etch-pits are formed on the GaN surface in 200oC H3PO4 at 5 minutes. The defect density calculated from observed etch-pits on surface was around 5 × 106/cm 2. This indicates that the fabricated GaN substrates can be used for applications in the field of optodevice, and high power electronics.

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