@article{ART001490368},
author={박병우 and Ho-Yong Shin and Jong Ho Kim and Jong In Im},
title={Molecular dynamic studies for elastic constant of SiC crystal at high temperature},
journal={Journal of the Korean Crystal Growth and Crystal Technology},
issn={1225-1429},
year={2010},
volume={20},
number={5},
pages={232-236}
TY - JOUR
AU - 박병우
AU - Ho-Yong Shin
AU - Jong Ho Kim
AU - Jong In Im
TI - Molecular dynamic studies for elastic constant of SiC crystal at high temperature
JO - Journal of the Korean Crystal Growth and Crystal Technology
PY - 2010
VL - 20
IS - 5
PB - The Korea Association Of Crystal Growth, Inc.
SP - 232
EP - 236
SN - 1225-1429
AB - Silicon carbide (SiC) ceramics are widely used in the application of high-temperature structural devices due to their light weight as well as superior hardness, fracture toughness, and temperature stability. In this paper, we employed classical molecular dynamics simulations using Tersoff’s potential to investigate the elastic constants of the SiC crystal at high temperature. The stress-strain characteristics of the SiC crystal were calculated with the LAMMPS software and the elastic constants of the SiC crystal were analyzed. Based on the stress-strain analysis, the SiC crystal has shown the elastic deformation characteristics at the low temperature region. But the slight plastic deformation behavior was shown as applied the high strain over 1,000oC. Also the elastic constants of the SiC crystal were changed from about 475 GPa to 425 GPa as increased the temperature to 1,250oC.
KW - Silicon carbide (SiC);Molecular dynamics simulations;Stress-strain characteristics;Elastic constants
DO -
UR -
ER -
박병우, Ho-Yong Shin, Jong Ho Kim and Jong In Im. (2010). Molecular dynamic studies for elastic constant of SiC crystal at high temperature. Journal of the Korean Crystal Growth and Crystal Technology, 20(5), 232-236.
박병우, Ho-Yong Shin, Jong Ho Kim and Jong In Im. 2010, "Molecular dynamic studies for elastic constant of SiC crystal at high temperature", Journal of the Korean Crystal Growth and Crystal Technology, vol.20, no.5 pp.232-236.
박병우, Ho-Yong Shin, Jong Ho Kim, Jong In Im "Molecular dynamic studies for elastic constant of SiC crystal at high temperature" Journal of the Korean Crystal Growth and Crystal Technology 20.5 pp.232-236 (2010) : 232.
박병우, Ho-Yong Shin, Jong Ho Kim, Jong In Im. Molecular dynamic studies for elastic constant of SiC crystal at high temperature. 2010; 20(5), 232-236.
박병우, Ho-Yong Shin, Jong Ho Kim and Jong In Im. "Molecular dynamic studies for elastic constant of SiC crystal at high temperature" Journal of the Korean Crystal Growth and Crystal Technology 20, no.5 (2010) : 232-236.
박병우; Ho-Yong Shin; Jong Ho Kim; Jong In Im. Molecular dynamic studies for elastic constant of SiC crystal at high temperature. Journal of the Korean Crystal Growth and Crystal Technology, 20(5), 232-236.
박병우; Ho-Yong Shin; Jong Ho Kim; Jong In Im. Molecular dynamic studies for elastic constant of SiC crystal at high temperature. Journal of the Korean Crystal Growth and Crystal Technology. 2010; 20(5) 232-236.
박병우, Ho-Yong Shin, Jong Ho Kim, Jong In Im. Molecular dynamic studies for elastic constant of SiC crystal at high temperature. 2010; 20(5), 232-236.
박병우, Ho-Yong Shin, Jong Ho Kim and Jong In Im. "Molecular dynamic studies for elastic constant of SiC crystal at high temperature" Journal of the Korean Crystal Growth and Crystal Technology 20, no.5 (2010) : 232-236.