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The molten KOH/NaOH wet chemical etching of HVPE-grown GaN

  • Journal of the Korean Crystal Growth and Crystal Technology
  • Abbr : J. Korean Cryst. Growth Cryst. Technol.
  • 2014, 24(4), pp.135-139
  • DOI : 10.6111/JKCGCT.2014.24.4.135
  • Publisher : The Korea Association Of Crystal Growth, Inc.
  • Research Area : Engineering > Materials Science and Engineering

Jae Hwa Park 1 홍윤표 1 Cheol Woo Park 1 Hyun-Mi Kim 1 오동근 1 Bonggeun Choi 1 Seong Kuk Lee 2 Kwang Bo Shim 1

1한양대학교
2유니모포트론

Accredited

ABSTRACT

The hydride vapor phase epitaxy (HVPE) grown GaN samples to precisely measure the surface characteristicswas applied to a molten KOH/NaOH wet chemical etching. The etching rate by molten KOH/NaOH wet chemical etchingmethod was slower than that by conventional etching methods, such as phosphoric and sulfuric acid etching, which may bedue to the formation of insoluble coating layer. Therefore, the molten KOH/NaOH wet chemical etching is a betterefficient method for the evaluation of etch pits density. The grown GaN single crystals were characterized by using X-raydiffraction (XRD) and X-ray rocking curve (XRC). The etching characteristics and surface morphologies were studied byscanning electron microscopy (SEM). From etching results, the optimum etching condition that the etch pits were wellindependently separated in space and clearly showed their shape, was 410oC and 25 min. The etch pits density obtained bymolten KOH/NaOH wet chemical etching under optimum etching condition was around 2.45 × 106cm−2, which iscommercially an available materials.

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