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Comparison of characteristics of silver-grid transparent conductive electrodes for display devices according to fabrication method

  • Journal of the Korean Crystal Growth and Crystal Technology
  • Abbr : J. Korean Cryst. Growth Cryst. Technol.
  • 2017, 27(2), pp.75-79
  • DOI : 10.6111/JKCGCT.2017.27.2.075
  • Publisher : The Korea Association Of Crystal Growth, Inc.
  • Research Area : Engineering > Materials Science and Engineering
  • Received : April 13, 2017
  • Accepted : April 19, 2017
  • Published : April 30, 2017

Choi ByoungSu 1 Seok Hwan Choi 1 Jeong-ho Ryu 2 Cho, Hyun 1

1부산대학교
2한국교통대학교

Accredited

ABSTRACT

Honeycomb-shaped Ag-grid transparent conductive electrodes (TCEs) were fabricated using two different processes, high density plasma etching and lift-off, and the optical and electrical properties were compared according to the fabrication method. For the fabrication of the Ag-grid TCEs by plasma etching, etch characteristics of the Ag thin film in 10CF4/5Ar inductively coupled plasma (ICP) discharges were studied. The Ag etch rate increased as the power increased at relatively low ICP source power or rf chuck power conditions, and then decreased at higher powers due to either decrease in Ar + ion energy or Ar + ion-assisted removal of the reactive F radicals. The Ag-grid TCEs fabricated by the 10CF4/5Ar ICP etching process showed better grid pattern transfer efficiency without any distortion or breakage in the grid pattern and higher optical transmittance values of average 83.3 % (pixel size 30 μm/line width 5 μm) and 71 % (pixel size 26 μm/line width 8 μm) in the visible range of spectrum, respectively. On the other hand, the Ag-grid TCEs fabricated by the lift-off process showed lower sheet resistance values of 2.163 Ω/□ (pixel size 26 μm/line width 8 μm) and 4.932 Ω/□ (pixel size 30 μm/line width 5 μm), respectively.

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