@article{ART002537791},
author={Seong Hwan park and Young Jae Ham and Jeong Seok kim and Kyounghun Kim and Seong Min So and Minseok Jeon},
title={Reliability assessment of mica high voltage capacitor through environmental test and accelerated life test},
journal={Journal of the Korean Crystal Growth and Crystal Technology},
issn={1225-1429},
year={2019},
volume={29},
number={6},
pages={270-275},
doi={10.6111/JKCGCT.2019.29.6.270}
TY - JOUR
AU - Seong Hwan park
AU - Young Jae Ham
AU - Jeong Seok kim
AU - Kyounghun Kim
AU - Seong Min So
AU - Minseok Jeon
TI - Reliability assessment of mica high voltage capacitor through environmental test and accelerated life test
JO - Journal of the Korean Crystal Growth and Crystal Technology
PY - 2019
VL - 29
IS - 6
PB - The Korea Association Of Crystal Growth, Inc.
SP - 270
EP - 275
SN - 1225-1429
AB - Mica capacitor is being adopted for high voltage firing unit of guided weapon system because of its superiorimpact enduring property relative to ceramic capacitor. Reliability of localized mica high voltage capacitors was verifiedthrough environmental test like terminal strength test, humidity test, thermal shock test and accelerated life test forapplication to high voltage firing unit. Failure mode of mica capacitor is a decrease of insulation resistance and its finaldielectric breakdown. Main constants of accelerated life model were derived experimentally and voltage constant andactivation energy were 5.28 and 0.805 eV respectively. Lifetime of mica capacitor at normal use condition was calculatedto be 38.5 years by acceleration factor, 496, and lifetime at accelerated condition and this long lifetime confirmed thatmica high voltage capacitor could be applied for firing unit.
KW - Mica high voltage capacitor;Lifetime;Mean time to failure;Firing device;Fuse
DO - 10.6111/JKCGCT.2019.29.6.270
ER -
Seong Hwan park, Young Jae Ham, Jeong Seok kim, Kyounghun Kim, Seong Min So and Minseok Jeon. (2019). Reliability assessment of mica high voltage capacitor through environmental test and accelerated life test. Journal of the Korean Crystal Growth and Crystal Technology, 29(6), 270-275.
Seong Hwan park, Young Jae Ham, Jeong Seok kim, Kyounghun Kim, Seong Min So and Minseok Jeon. 2019, "Reliability assessment of mica high voltage capacitor through environmental test and accelerated life test", Journal of the Korean Crystal Growth and Crystal Technology, vol.29, no.6 pp.270-275. Available from: doi:10.6111/JKCGCT.2019.29.6.270
Seong Hwan park, Young Jae Ham, Jeong Seok kim, Kyounghun Kim, Seong Min So, Minseok Jeon "Reliability assessment of mica high voltage capacitor through environmental test and accelerated life test" Journal of the Korean Crystal Growth and Crystal Technology 29.6 pp.270-275 (2019) : 270.
Seong Hwan park, Young Jae Ham, Jeong Seok kim, Kyounghun Kim, Seong Min So, Minseok Jeon. Reliability assessment of mica high voltage capacitor through environmental test and accelerated life test. 2019; 29(6), 270-275. Available from: doi:10.6111/JKCGCT.2019.29.6.270
Seong Hwan park, Young Jae Ham, Jeong Seok kim, Kyounghun Kim, Seong Min So and Minseok Jeon. "Reliability assessment of mica high voltage capacitor through environmental test and accelerated life test" Journal of the Korean Crystal Growth and Crystal Technology 29, no.6 (2019) : 270-275.doi: 10.6111/JKCGCT.2019.29.6.270
Seong Hwan park; Young Jae Ham; Jeong Seok kim; Kyounghun Kim; Seong Min So; Minseok Jeon. Reliability assessment of mica high voltage capacitor through environmental test and accelerated life test. Journal of the Korean Crystal Growth and Crystal Technology, 29(6), 270-275. doi: 10.6111/JKCGCT.2019.29.6.270
Seong Hwan park; Young Jae Ham; Jeong Seok kim; Kyounghun Kim; Seong Min So; Minseok Jeon. Reliability assessment of mica high voltage capacitor through environmental test and accelerated life test. Journal of the Korean Crystal Growth and Crystal Technology. 2019; 29(6) 270-275. doi: 10.6111/JKCGCT.2019.29.6.270
Seong Hwan park, Young Jae Ham, Jeong Seok kim, Kyounghun Kim, Seong Min So, Minseok Jeon. Reliability assessment of mica high voltage capacitor through environmental test and accelerated life test. 2019; 29(6), 270-275. Available from: doi:10.6111/JKCGCT.2019.29.6.270
Seong Hwan park, Young Jae Ham, Jeong Seok kim, Kyounghun Kim, Seong Min So and Minseok Jeon. "Reliability assessment of mica high voltage capacitor through environmental test and accelerated life test" Journal of the Korean Crystal Growth and Crystal Technology 29, no.6 (2019) : 270-275.doi: 10.6111/JKCGCT.2019.29.6.270
