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Spatial variation in quality of Ga2O3 single crystal grown by edge-defined film-fed growth method

  • Journal of the Korean Crystal Growth and Crystal Technology
  • Abbr : J. Korean Cryst. Growth Cryst. Technol.
  • 2022, 32(4), pp.121-127
  • DOI : 10.6111/JKCGCT.2022.32.4.121
  • Publisher : The Korea Association Of Crystal Growth, Inc.
  • Research Area : Engineering > Materials Science and Engineering
  • Received : July 20, 2022
  • Accepted : August 4, 2022
  • Published : August 31, 2022

Su-Bin Park 1 Tae-Wan Je 1 Hui-Yeon Jang 1 Su-Min Choi 1 Mi-Seon Park 1 Yeon-Suk Jang 1 Yoon-Gon Moon 2 Jin-Ki Kang 3 Lee, Won Jae 1

1동의대학교
2(주) 악셀 R & D 센터
3(주)악셀

Accredited

ABSTRACT

β-Gallium oxide (Ga₂O₃), an ultra-wide bandgap semiconductor, has attracted great attention due to its promising applications for high voltage power devices. The most stable phase among five different polytypes, β-Ga₂O₃ has the wider bandgap of 4.9 eV and higher breakdown electric field of 8 MV/cm. Furthermore, it can be grown from melt source, implying higher growth rate and lower fabrication cost than other wide bandgap semiconductors such as SiC, GaN and diamond for the power device applications. In this study, β-Ga₂O₃bulk crystals were grown by the edge-defined film-fed growth (EFG) process. The growth direction and the principal surface were set to be the [010] direction and the (100) plane of the β- Ga₂O₃ crystal, respectively. The spectra measured by Raman analysis could exhibit the crystal phase and impurity doping in the β-Ga₂O₃ ingot, and the crystallinity quality and crystal direction were analyzed using high-resolution X-ray diffraction (HRXRD). The crystal quality and various properties of as-grown β-Ga₂O₃ ribbon was systematically analyzed in order to investigate the spatial variation in entire crystal grown by EFG method.

Citation status

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This paper was written with support from the National Research Foundation of Korea.