KJCKorea
Journal Central

@article{ART002907814},
author={Hae Jun Ahn and Seung Hun Huh and Youngho Jee and BYEONG WOO LEE},
title={Characterization of few-layered reduced graphene oxide (rGO) for standardization},
journal={Journal of the Korean Crystal Growth and Crystal Technology},
issn={1225-1429},
year={2022},
volume={32},
number={6},
pages={239-245},
doi={10.6111/JKCGCT.2022.32.6.239}

TY - JOUR
AU - Hae Jun Ahn
AU - Seung Hun Huh
AU - Youngho Jee
AU - BYEONG WOO LEE
TI - Characterization of few-layered reduced graphene oxide (rGO) for standardization
JO - Journal of the Korean Crystal Growth and Crystal Technology
PY - 2022
VL - 32
IS - 6
PB - The Korea Association Of Crystal Growth, Inc.
SP - 239
EP - 245
SN - 1225-1429
AB - Reduced graphene oxide (rGO) has attracted many attention and applications due to its excellent electrochemical ability. Therefore, standardization of rGO through structural and thermal analysis facilitates quality improvement and management, enabling users to increase efficiency and reduce relevant costs. For rGO and graphene-related materials, it is very important to determine the number of layers and define the resulting difference in physical properties. In this study, 3~4 layers of rGO-1 and 9~10 layers of rGO-2 were obtained from graphene oxide (GO) through a hydrazine reduction process. For the prepared rGOs, X-ray diffraction (XRD) pattern obtained a diffraction peak at 2θ≈25° related to (002) reflection was used to calculate the layer numbers by determining interlayer distance and FWHM value. To reduce the angular uncertainty, XRD data analysis was performed with angle correction using standard reference materials for X-ray powder diffraction analysis. Precise interlayer distance and number of layers were determined using OriginLab and opensource XRD diffraction analysis programs using the angle-corrected diffraction data. TG-DSC thermal analysis was performed to further standardize the physical properties of rGO samples.
KW - Reduced graphene oxide;Standardization;XRD;Number of layers;Structural analysis
DO - 10.6111/JKCGCT.2022.32.6.239
ER -

Hae Jun Ahn, Seung Hun Huh, Youngho Jee and BYEONG WOO LEE. (2022). Characterization of few-layered reduced graphene oxide (rGO) for standardization. Journal of the Korean Crystal Growth and Crystal Technology, 32(6), 239-245.

Hae Jun Ahn, Seung Hun Huh, Youngho Jee and BYEONG WOO LEE. 2022, "Characterization of few-layered reduced graphene oxide (rGO) for standardization", Journal of the Korean Crystal Growth and Crystal Technology, vol.32, no.6 pp.239-245. Available from: doi:10.6111/JKCGCT.2022.32.6.239

Hae Jun Ahn, Seung Hun Huh, Youngho Jee, BYEONG WOO LEE "Characterization of few-layered reduced graphene oxide (rGO) for standardization" Journal of the Korean Crystal Growth and Crystal Technology 32.6 pp.239-245 (2022) : 239.

Hae Jun Ahn, Seung Hun Huh, Youngho Jee, BYEONG WOO LEE. Characterization of few-layered reduced graphene oxide (rGO) for standardization. 2022; 32(6), 239-245. Available from: doi:10.6111/JKCGCT.2022.32.6.239

Hae Jun Ahn, Seung Hun Huh, Youngho Jee and BYEONG WOO LEE. "Characterization of few-layered reduced graphene oxide (rGO) for standardization" Journal of the Korean Crystal Growth and Crystal Technology 32, no.6 (2022) : 239-245.doi: 10.6111/JKCGCT.2022.32.6.239

Hae Jun Ahn; Seung Hun Huh; Youngho Jee; BYEONG WOO LEE. Characterization of few-layered reduced graphene oxide (rGO) for standardization. Journal of the Korean Crystal Growth and Crystal Technology, 32(6), 239-245. doi: 10.6111/JKCGCT.2022.32.6.239

Hae Jun Ahn; Seung Hun Huh; Youngho Jee; BYEONG WOO LEE. Characterization of few-layered reduced graphene oxide (rGO) for standardization. Journal of the Korean Crystal Growth and Crystal Technology. 2022; 32(6) 239-245. doi: 10.6111/JKCGCT.2022.32.6.239

Hae Jun Ahn, Seung Hun Huh, Youngho Jee, BYEONG WOO LEE. Characterization of few-layered reduced graphene oxide (rGO) for standardization. 2022; 32(6), 239-245. Available from: doi:10.6111/JKCGCT.2022.32.6.239

Hae Jun Ahn, Seung Hun Huh, Youngho Jee and BYEONG WOO LEE. "Characterization of few-layered reduced graphene oxide (rGO) for standardization" Journal of the Korean Crystal Growth and Crystal Technology 32, no.6 (2022) : 239-245.doi: 10.6111/JKCGCT.2022.32.6.239