@article{ART002989414},
author={Ahn Nam Jun and Jang Beom An and Hyung Soo Ahn and Kyoung Hwa Kim and Min Yang},
title={Formation of amorphous Ga2O3 thin films on Ti metal substrates by MOCVD and characteristics of diodes},
journal={Journal of the Korean Crystal Growth and Crystal Technology},
issn={1225-1429},
year={2023},
volume={33},
number={4},
pages={125-131},
doi={10.6111/JKCGCT.2023.33.4.125}
TY - JOUR
AU - Ahn Nam Jun
AU - Jang Beom An
AU - Hyung Soo Ahn
AU - Kyoung Hwa Kim
AU - Min Yang
TI - Formation of amorphous Ga2O3 thin films on Ti metal substrates by MOCVD and characteristics of diodes
JO - Journal of the Korean Crystal Growth and Crystal Technology
PY - 2023
VL - 33
IS - 4
PB - The Korea Association Of Crystal Growth, Inc.
SP - 125
EP - 131
SN - 1225-1429
AB - Ga₂O₃ thin films were deposited on Ti substrates using metal organic chemical vapor deposition (MOCVD) at temperatures ranging from 350 to 500°C. Lower deposition temperatures were chosen to minimize thermal deformation of the Ti substrate and its impact on the Ga₂O₃ film. Film surfaces tended to become rough at temperatures below 500°C due to three-dimensional growth, but the film formed at 500°C had the most uniform surface. All deposited films were amorphous in structure. Vertical Schottky diodes were fabricated and I-V and C-V measurements were performed. I-V measurements showed higher operating voltages compared to a typical SBD for films grown at different temperatures. The sample grown at 500°C, which had the most uniform surface, exhibited the lowest operating voltage. Higher growthtemperatures resulted in higher capacitance values according to C-V measurements
KW - MOCVD;Ga₂O₃;Amorphous;Metal substrate
DO - 10.6111/JKCGCT.2023.33.4.125
ER -
Ahn Nam Jun, Jang Beom An, Hyung Soo Ahn, Kyoung Hwa Kim and Min Yang. (2023). Formation of amorphous Ga2O3 thin films on Ti metal substrates by MOCVD and characteristics of diodes. Journal of the Korean Crystal Growth and Crystal Technology, 33(4), 125-131.
Ahn Nam Jun, Jang Beom An, Hyung Soo Ahn, Kyoung Hwa Kim and Min Yang. 2023, "Formation of amorphous Ga2O3 thin films on Ti metal substrates by MOCVD and characteristics of diodes", Journal of the Korean Crystal Growth and Crystal Technology, vol.33, no.4 pp.125-131. Available from: doi:10.6111/JKCGCT.2023.33.4.125
Ahn Nam Jun, Jang Beom An, Hyung Soo Ahn, Kyoung Hwa Kim, Min Yang "Formation of amorphous Ga2O3 thin films on Ti metal substrates by MOCVD and characteristics of diodes" Journal of the Korean Crystal Growth and Crystal Technology 33.4 pp.125-131 (2023) : 125.
Ahn Nam Jun, Jang Beom An, Hyung Soo Ahn, Kyoung Hwa Kim, Min Yang. Formation of amorphous Ga2O3 thin films on Ti metal substrates by MOCVD and characteristics of diodes. 2023; 33(4), 125-131. Available from: doi:10.6111/JKCGCT.2023.33.4.125
Ahn Nam Jun, Jang Beom An, Hyung Soo Ahn, Kyoung Hwa Kim and Min Yang. "Formation of amorphous Ga2O3 thin films on Ti metal substrates by MOCVD and characteristics of diodes" Journal of the Korean Crystal Growth and Crystal Technology 33, no.4 (2023) : 125-131.doi: 10.6111/JKCGCT.2023.33.4.125
Ahn Nam Jun; Jang Beom An; Hyung Soo Ahn; Kyoung Hwa Kim; Min Yang. Formation of amorphous Ga2O3 thin films on Ti metal substrates by MOCVD and characteristics of diodes. Journal of the Korean Crystal Growth and Crystal Technology, 33(4), 125-131. doi: 10.6111/JKCGCT.2023.33.4.125
Ahn Nam Jun; Jang Beom An; Hyung Soo Ahn; Kyoung Hwa Kim; Min Yang. Formation of amorphous Ga2O3 thin films on Ti metal substrates by MOCVD and characteristics of diodes. Journal of the Korean Crystal Growth and Crystal Technology. 2023; 33(4) 125-131. doi: 10.6111/JKCGCT.2023.33.4.125
Ahn Nam Jun, Jang Beom An, Hyung Soo Ahn, Kyoung Hwa Kim, Min Yang. Formation of amorphous Ga2O3 thin films on Ti metal substrates by MOCVD and characteristics of diodes. 2023; 33(4), 125-131. Available from: doi:10.6111/JKCGCT.2023.33.4.125
Ahn Nam Jun, Jang Beom An, Hyung Soo Ahn, Kyoung Hwa Kim and Min Yang. "Formation of amorphous Ga2O3 thin films on Ti metal substrates by MOCVD and characteristics of diodes" Journal of the Korean Crystal Growth and Crystal Technology 33, no.4 (2023) : 125-131.doi: 10.6111/JKCGCT.2023.33.4.125