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Formation of amorphous Ga2O3 thin films on Ti metal substrates by MOCVD and characteristics of diodes

  • Journal of the Korean Crystal Growth and Crystal Technology
  • Abbr : J. Korean Cryst. Growth Cryst. Technol.
  • 2023, 33(4), pp.125-131
  • DOI : 10.6111/JKCGCT.2023.33.4.125
  • Publisher : The Korea Association Of Crystal Growth, Inc.
  • Research Area : Engineering > Materials Science and Engineering
  • Received : June 23, 2023
  • Accepted : July 20, 2023
  • Published : August 31, 2023

Ahn Nam Jun 1 Jang Beom An 1 Hyung Soo Ahn 1 Kyoung Hwa Kim 2 Min Yang 1

1한국해양대학교
2한국해양대학교 화합물반도체공정교육센터

Accredited

ABSTRACT

Ga₂O₃ thin films were deposited on Ti substrates using metal organic chemical vapor deposition (MOCVD) at temperatures ranging from 350 to 500°C. Lower deposition temperatures were chosen to minimize thermal deformation of the Ti substrate and its impact on the Ga₂O₃ film. Film surfaces tended to become rough at temperatures below 500°C due to three-dimensional growth, but the film formed at 500°C had the most uniform surface. All deposited films were amorphous in structure. Vertical Schottky diodes were fabricated and I-V and C-V measurements were performed. I-V measurements showed higher operating voltages compared to a typical SBD for films grown at different temperatures. The sample grown at 500°C, which had the most uniform surface, exhibited the lowest operating voltage. Higher growthtemperatures resulted in higher capacitance values according to C-V measurements

Citation status

* References for papers published after 2023 are currently being built.