@article{ART002235239},
author={Sunghoon Son},
title={Error Recovery Technique for Improving Reliability of Embedded Systems},
journal={Journal of The Korea Society of Computer and Information},
issn={1598-849X},
year={2017},
volume={22},
number={6},
pages={1-8},
doi={10.9708/jksci.2017.22.06.001}
TY - JOUR
AU - Sunghoon Son
TI - Error Recovery Technique for Improving Reliability of Embedded Systems
JO - Journal of The Korea Society of Computer and Information
PY - 2017
VL - 22
IS - 6
PB - The Korean Society Of Computer And Information
SP - 1
EP - 8
SN - 1598-849X
AB - In this paper, we propose a fault tolerance technique which enables embedded systems to run without interruption while its operating system and tasks fail. In order to improve reliability, the proposed scheme makes an embedded system run as a virtual machine on virtual machine monitor. It also prepares a contingency virtual machine at which periodical backups of the embedded system are saved. When an error occurs in the main virtual machine, the corresponding standby virtual machine takes a role of the main virtual machine and continues its operation. Especially such backups and switches of virtual machines are performed with minor performance degradation by manipulating page table entries in virtual machine monitor. By conducting performance evaluation studies, we show that the proposed scheme makes embedded system robust against errors while it does not degrade the performance of the system significantly.
KW - Embedded System;Reliability;Error Recovery;Fault Tolerance
DO - 10.9708/jksci.2017.22.06.001
ER -
Sunghoon Son. (2017). Error Recovery Technique for Improving Reliability of Embedded Systems. Journal of The Korea Society of Computer and Information, 22(6), 1-8.
Sunghoon Son. 2017, "Error Recovery Technique for Improving Reliability of Embedded Systems", Journal of The Korea Society of Computer and Information, vol.22, no.6 pp.1-8. Available from: doi:10.9708/jksci.2017.22.06.001
Sunghoon Son "Error Recovery Technique for Improving Reliability of Embedded Systems" Journal of The Korea Society of Computer and Information 22.6 pp.1-8 (2017) : 1.
Sunghoon Son. Error Recovery Technique for Improving Reliability of Embedded Systems. 2017; 22(6), 1-8. Available from: doi:10.9708/jksci.2017.22.06.001
Sunghoon Son. "Error Recovery Technique for Improving Reliability of Embedded Systems" Journal of The Korea Society of Computer and Information 22, no.6 (2017) : 1-8.doi: 10.9708/jksci.2017.22.06.001
Sunghoon Son. Error Recovery Technique for Improving Reliability of Embedded Systems. Journal of The Korea Society of Computer and Information, 22(6), 1-8. doi: 10.9708/jksci.2017.22.06.001
Sunghoon Son. Error Recovery Technique for Improving Reliability of Embedded Systems. Journal of The Korea Society of Computer and Information. 2017; 22(6) 1-8. doi: 10.9708/jksci.2017.22.06.001
Sunghoon Son. Error Recovery Technique for Improving Reliability of Embedded Systems. 2017; 22(6), 1-8. Available from: doi:10.9708/jksci.2017.22.06.001
Sunghoon Son. "Error Recovery Technique for Improving Reliability of Embedded Systems" Journal of The Korea Society of Computer and Information 22, no.6 (2017) : 1-8.doi: 10.9708/jksci.2017.22.06.001
