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Circuit card inspection method through digital circuit design based AITS

  • Journal of The Korea Society of Computer and Information
  • Abbr : JKSCI
  • 2018, 23(8), pp.1-7
  • DOI : 10.9708/jksci.2018.23.08.001
  • Publisher : The Korean Society Of Computer And Information
  • Research Area : Engineering > Computer Science
  • Received : April 13, 2018
  • Accepted : August 10, 2018
  • Published : August 31, 2018

Ji-Hoon Han 1

1한화시스템

Accredited

ABSTRACT

Previous test equipment was bulky, took a long time to check, and was somewhat less economical. Since most of the checks were about analog signals, we preferred to check them using reference equipments. In this paper, a digital circuit design based on AITS is used to implement signals that can not utilize commercial measurement resources, and also designed and manufactured equipment that can inspect SRU. These test equipments were tested and evaluated by development, operation, and field evaluation, and they were installed to the Korean Field Force. This contributed to the improvement of operability by shortening the inspection time from 83.2 minutes to 7.8 minutes on average In addition, it did not utilize the reference equipment, so it could play a big role in lowering the mass production cost.

Citation status

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