@article{ART002377509},
author={Ji-Hoon Han},
title={Circuit card inspection method through digital circuit design based AITS},
journal={Journal of The Korea Society of Computer and Information},
issn={1598-849X},
year={2018},
volume={23},
number={8},
pages={1-7},
doi={10.9708/jksci.2018.23.08.001}
TY - JOUR
AU - Ji-Hoon Han
TI - Circuit card inspection method through digital circuit design based AITS
JO - Journal of The Korea Society of Computer and Information
PY - 2018
VL - 23
IS - 8
PB - The Korean Society Of Computer And Information
SP - 1
EP - 7
SN - 1598-849X
AB - Previous test equipment was bulky, took a long time to check, and was somewhat less economical. Since most of the checks were about analog signals, we preferred to check them using reference equipments.
In this paper, a digital circuit design based on AITS is used to implement signals that can not utilize commercial measurement resources, and also designed and manufactured equipment that can inspect SRU. These test equipments were tested and evaluated by development, operation, and field evaluation, and they were installed to the Korean Field Force.
This contributed to the improvement of operability by shortening the inspection time from 83.2 minutes to 7.8 minutes on average In addition, it did not utilize the reference equipment, so it could play a big role in lowering the mass production cost.
KW - Digital Circuit;Automatic Integrated Test Station;UUT;VHDL;FPGA
DO - 10.9708/jksci.2018.23.08.001
ER -
Ji-Hoon Han. (2018). Circuit card inspection method through digital circuit design based AITS. Journal of The Korea Society of Computer and Information, 23(8), 1-7.
Ji-Hoon Han. 2018, "Circuit card inspection method through digital circuit design based AITS", Journal of The Korea Society of Computer and Information, vol.23, no.8 pp.1-7. Available from: doi:10.9708/jksci.2018.23.08.001
Ji-Hoon Han "Circuit card inspection method through digital circuit design based AITS" Journal of The Korea Society of Computer and Information 23.8 pp.1-7 (2018) : 1.
Ji-Hoon Han. Circuit card inspection method through digital circuit design based AITS. 2018; 23(8), 1-7. Available from: doi:10.9708/jksci.2018.23.08.001
Ji-Hoon Han. "Circuit card inspection method through digital circuit design based AITS" Journal of The Korea Society of Computer and Information 23, no.8 (2018) : 1-7.doi: 10.9708/jksci.2018.23.08.001
Ji-Hoon Han. Circuit card inspection method through digital circuit design based AITS. Journal of The Korea Society of Computer and Information, 23(8), 1-7. doi: 10.9708/jksci.2018.23.08.001
Ji-Hoon Han. Circuit card inspection method through digital circuit design based AITS. Journal of The Korea Society of Computer and Information. 2018; 23(8) 1-7. doi: 10.9708/jksci.2018.23.08.001
Ji-Hoon Han. Circuit card inspection method through digital circuit design based AITS. 2018; 23(8), 1-7. Available from: doi:10.9708/jksci.2018.23.08.001
Ji-Hoon Han. "Circuit card inspection method through digital circuit design based AITS" Journal of The Korea Society of Computer and Information 23, no.8 (2018) : 1-7.doi: 10.9708/jksci.2018.23.08.001
