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@article{ART002385939},
author={Na-Young Lee and Kwon, Ki Tae},
title={Defect Severity-based Defect Prediction Model using CL},
journal={Journal of The Korea Society of Computer and Information},
issn={1598-849X},
year={2018},
volume={23},
number={9},
pages={81-86},
doi={10.9708/jksci.2018.23.09.081}

TY - JOUR
AU - Na-Young Lee
AU - Kwon, Ki Tae
TI - Defect Severity-based Defect Prediction Model using CL
JO - Journal of The Korea Society of Computer and Information
PY - 2018
VL - 23
IS - 9
PB - The Korean Society Of Computer And Information
SP - 81
EP - 86
SN - 1598-849X
AB - Software defect severity is very important in projects with limited historical data or new projects. But general software defect prediction is very difficult to collect the label information of the training set and cross-project defect prediction must have a lot of data. In this paper, an unclassified data set with defect severity is clustered according to the distribution ratio. And defect severity-based prediction model is proposed by way of labeling. Proposed model is applied CLAMI in JM1, PC4 with the least ambiguity of defect severity-based NASA dataset. And it is evaluated the value of ACC compared to original data. In this study experiment result, proposed model is improved JM1 0.15 (15%), PC4 0.12(12%) than existing defect severity-based prediction models.
KW - Software Quality;Software Defect Severity;Label Clustering;Statistical Significance
DO - 10.9708/jksci.2018.23.09.081
ER -

Na-Young Lee and Kwon, Ki Tae. (2018). Defect Severity-based Defect Prediction Model using CL. Journal of The Korea Society of Computer and Information, 23(9), 81-86.

Na-Young Lee and Kwon, Ki Tae. 2018, "Defect Severity-based Defect Prediction Model using CL", Journal of The Korea Society of Computer and Information, vol.23, no.9 pp.81-86. Available from: doi:10.9708/jksci.2018.23.09.081

Na-Young Lee, Kwon, Ki Tae "Defect Severity-based Defect Prediction Model using CL" Journal of The Korea Society of Computer and Information 23.9 pp.81-86 (2018) : 81.

Na-Young Lee, Kwon, Ki Tae. Defect Severity-based Defect Prediction Model using CL. 2018; 23(9), 81-86. Available from: doi:10.9708/jksci.2018.23.09.081

Na-Young Lee and Kwon, Ki Tae. "Defect Severity-based Defect Prediction Model using CL" Journal of The Korea Society of Computer and Information 23, no.9 (2018) : 81-86.doi: 10.9708/jksci.2018.23.09.081

Na-Young Lee; Kwon, Ki Tae. Defect Severity-based Defect Prediction Model using CL. Journal of The Korea Society of Computer and Information, 23(9), 81-86. doi: 10.9708/jksci.2018.23.09.081

Na-Young Lee; Kwon, Ki Tae. Defect Severity-based Defect Prediction Model using CL. Journal of The Korea Society of Computer and Information. 2018; 23(9) 81-86. doi: 10.9708/jksci.2018.23.09.081

Na-Young Lee, Kwon, Ki Tae. Defect Severity-based Defect Prediction Model using CL. 2018; 23(9), 81-86. Available from: doi:10.9708/jksci.2018.23.09.081

Na-Young Lee and Kwon, Ki Tae. "Defect Severity-based Defect Prediction Model using CL" Journal of The Korea Society of Computer and Information 23, no.9 (2018) : 81-86.doi: 10.9708/jksci.2018.23.09.081