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@article{ART002448724},
author={Sungho Kim and Jong Wook Kwak},
title={Analysis of Potential Risks for Garbage Collection and Wear Leveling Interference in FTL-based NAND Flash Memory},
journal={Journal of The Korea Society of Computer and Information},
issn={1598-849X},
year={2019},
volume={24},
number={3},
pages={1-9},
doi={10.9708/jksci.2019.24.03.001}

TY - JOUR
AU - Sungho Kim
AU - Jong Wook Kwak
TI - Analysis of Potential Risks for Garbage Collection and Wear Leveling Interference in FTL-based NAND Flash Memory
JO - Journal of The Korea Society of Computer and Information
PY - 2019
VL - 24
IS - 3
PB - The Korean Society Of Computer And Information
SP - 1
EP - 9
SN - 1598-849X
AB - This paper presents three potential risks in an environment that simultaneously performs the garbage collection and wear leveling in NAND flash memory. These risks may not only disturb the lifespan improvement of NAND flash memory, but also impose an additional overhead of page migrations. In this paper, we analyze the interference of garbage collection and wear leveling and we also provide two theoretical considerations for lifespan prolongation of NAND flash memory. To prove two solutions of three risks, we construct a simulation, based on DiskSim 4.0 and confirm realistic impacts of three risks in NAND flash memory. In experimental results, we found negative impacts of three risks and confirmed the necessity for a coordinator module between garbage collection and wear leveling for reducing the overhead and prolonging the lifespan of NAND flash memory.
KW - NAND Flash Memory;Wear Leveling;Garbage Collection;Lifespan;Interference Risk
DO - 10.9708/jksci.2019.24.03.001
ER -

Sungho Kim and Jong Wook Kwak. (2019). Analysis of Potential Risks for Garbage Collection and Wear Leveling Interference in FTL-based NAND Flash Memory. Journal of The Korea Society of Computer and Information, 24(3), 1-9.

Sungho Kim and Jong Wook Kwak. 2019, "Analysis of Potential Risks for Garbage Collection and Wear Leveling Interference in FTL-based NAND Flash Memory", Journal of The Korea Society of Computer and Information, vol.24, no.3 pp.1-9. Available from: doi:10.9708/jksci.2019.24.03.001

Sungho Kim, Jong Wook Kwak "Analysis of Potential Risks for Garbage Collection and Wear Leveling Interference in FTL-based NAND Flash Memory" Journal of The Korea Society of Computer and Information 24.3 pp.1-9 (2019) : 1.

Sungho Kim, Jong Wook Kwak. Analysis of Potential Risks for Garbage Collection and Wear Leveling Interference in FTL-based NAND Flash Memory. 2019; 24(3), 1-9. Available from: doi:10.9708/jksci.2019.24.03.001

Sungho Kim and Jong Wook Kwak. "Analysis of Potential Risks for Garbage Collection and Wear Leveling Interference in FTL-based NAND Flash Memory" Journal of The Korea Society of Computer and Information 24, no.3 (2019) : 1-9.doi: 10.9708/jksci.2019.24.03.001

Sungho Kim; Jong Wook Kwak. Analysis of Potential Risks for Garbage Collection and Wear Leveling Interference in FTL-based NAND Flash Memory. Journal of The Korea Society of Computer and Information, 24(3), 1-9. doi: 10.9708/jksci.2019.24.03.001

Sungho Kim; Jong Wook Kwak. Analysis of Potential Risks for Garbage Collection and Wear Leveling Interference in FTL-based NAND Flash Memory. Journal of The Korea Society of Computer and Information. 2019; 24(3) 1-9. doi: 10.9708/jksci.2019.24.03.001

Sungho Kim, Jong Wook Kwak. Analysis of Potential Risks for Garbage Collection and Wear Leveling Interference in FTL-based NAND Flash Memory. 2019; 24(3), 1-9. Available from: doi:10.9708/jksci.2019.24.03.001

Sungho Kim and Jong Wook Kwak. "Analysis of Potential Risks for Garbage Collection and Wear Leveling Interference in FTL-based NAND Flash Memory" Journal of The Korea Society of Computer and Information 24, no.3 (2019) : 1-9.doi: 10.9708/jksci.2019.24.03.001