K-means clustering analysis and differential protection policy according to 3D NAND flash memory error rate to improve SSD reliability (SSD 신뢰성 향상을 위한 3D 낸드 플래시 메모리 오류율에 따른 K-means 클러스터링 분석 및 차별화된 보호 정책)

Seung-Woo Son (손승우); Kim Jae Ho (김재호)

doi:10.9708/jksci.2021.26.11.001

K-means clustering analysis and differential protection policy according to 3D NAND flash memory error rate to improve SSD reliability

Journal of The Korea Society of Computer and Information
Abbr : JKSCI
2021, 26(11), pp.1-9
DOI : 10.9708/jksci.2021.26.11.001
Publisher : The Korean Society Of Computer And Information
Research Area : Engineering > Computer Science
Received : September 6, 2021
Accepted : November 22, 2021
Published : November 30, 2021

Seung-Woo Son ¹, Kim Jae Ho ¹

¹경상국립대학교

Accredited

ABSTRACT

3D-NAND flash memory provides high capacity per unit area by stacking 2D-NAND cells having a planar structure. However, due to the nature of the lamination process, there is a problem that the frequency of error occurrence may vary depending on each layer or physical cell location. This phenomenon becomes more pronounced as the number of write/erase(P/E) operations of the flash memory increases. Most flash-based storage devices such as SSDs use ECC for error correction. Since this method provides a fixed strength of data protection for all flash memory pages, it has limitations in 3D NAND flash memory, where the error rate varies depending on the physical location. Therefore, in this paper, pages and layers with different error rates are classified into clusters through the K-means machine learning algorithm, and differentiated data protection strength is applied to each cluster. We classify pages and layers based on the number of errors measured after endurance test, where the error rate varies significantly for each page and layer, and add parity data to stripes for areas vulnerable to errors to provides differentiate data protection strength. We show the possibility that this differentiated data protection policy can contribute to the improvement of reliability and lifespan of 3D NAND flash memory compared to the protection techniques using RAID-like or ECC alone.

KEYWORDS

Reliability, 3D-NAND Flash, Bit error rate, RAID, Cluster, K-means

Citation status

* References for papers published after 2023 are currently being built.

[confproc] Cristian Zambelli / 2019 / Reliability challenges in 3D NAND Flash memories / IEEE 11th International Memory Workshop(IMW)

[journal] Rino Micheloni / 2017 / Array Architectures for 3-D NAND Flash Memories / Proceedings of the IEEE / Institute of Electrical and Electronics Engineers (IEEE) 105(9) : 1634~1649

[confproc] H. Kim / 2017 / Evolution of NAND Flash Memory: From 2D to 3D as a Storage Market Leader / IEEE International Memory Workshop (IMW) : 1~4

[confproc] Seung woo Son / 2021 / Improve reliability of SSD through cluster analysis based on error rate of 3D-NAND flash and application of differentiated protection policy / 64th Proceedings of KSCI Conference 2021

[confproc] Agrawal, N. / 2008 / Design tradeoffs for SSD performance / 2008USENIX ATC / USENIX Association : 57~70

[journal] Seong, Y.J / 2010 / Hydra: A Block-Mapped Parallel Flash Memory Solid-State Disk Architecture / IEEE Trans. Comput. 59 : 905~921

[confproc] Chen, F. / 2009 / Understanding Intrinsic Characteristics and System Implications of Flash Memory Based Solid State Drives / Proceedings of the Eleventh International Joint Conference on Measurement and Modeling of Computer Systems : 181~192

[confproc] Jung, M. / 2012 / An Evaluation of Different Page Allocation Strategies on High-speed SSDs / Proceedings of the USENIX Workshop on Hot Topics in Storage and File Systems (HotStorage)

[confproc] Lee, J / 2009 / CPS-SIM:Configurable and accurate clock precision solid state drive simulator / Proceedings of the 2009 ACM Symposium on Applied Computing : 318~325

[confproc] Jaeho Kim / 2013 / Improving SSD Reliability with RAID via Elastic Striping and Anywhere Parity / 2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)

[journal] Kim, J / 2002 / A space-efficient flash translation layer for CompactFlash systems / IEEE Trans. Consum. Electron. 48 : 366~375

[confproc] Jaeho Kim / 2020 / Building Reliable Massive Capacity SSDs through a Flash Aware RAID-Like Protection / IEEE International Conference on Consumer Electronics (ICCE) 2020

[web] / 2019 / Flash Memory / Wikipedia / https://en.wikipedia.org/wiki/Flash_memory

[confproc] Yuqian Pan / Process-variation Effects on 3D TLC Flash Reliability:Characterization and Mitigation Scheme / 2020 IEEE 20th International Conference on Software Quality, Reliability and Security (QRS)

[journal] L. Shi / 2015 / Exploiting process variation for write performance improvement on nand flash memory storage systems / IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 : 334~337

[journal] Yejia Di / 2018 / Minimizing Retention Induced Refresh Through Exploiting Process Variation of Flash Memory / IEEE Transactions on Computers 68 : 83~98

[confproc] C. Zambelli / 2017 / Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization / IEEE International Memory Workshop (IMW) : 1~4

[confproc] J. MacQueen / Some methods for classification and analysis of multi- variate observations / Proc. of Berkeley Symp. on Math. Statistics and Prob

[report] Gary, J. / 2005 / Empirical Measurements of Disk Failure Rates and Error Rates / Microsoft

[confproc] Nikolaos Papandreou / 2019 / Characterization and Analysis of Bit Errors in 3D TLC NAND Flash Memory / 2019 IEEE International Reliability Physics Symposium (IRPS)

This paper was written with support from the National Research Foundation of Korea.

KJCKorea
Journal Central

Journal of The Korea Society of Computer and Information 2023 KCI Impact Factor : 0.65

K-means clustering analysis and differential protection policy according to 3D NAND flash memory error rate to improve SSD reliability

ABSTRACT

KEYWORDS

Citation status

* References for papers published after 2023 are currently being built.

Journal of The Korea Society of Computer and Information 2023 KCI Impact Factor : 0.65

K-means clustering analysis and differential protection policy according to 3D NAND flash memory error rate to improve SSD reliability

ABSTRACT

KEYWORDS

Statistics

Tools

Issue List

Citation status

KCI Citation Counts (0)

REFERENCES (20) * References for papers published after 2023 are currently being built.

Search PDF

Citation

* References for papers published after 2023 are currently being built.