@article{ART003338855},
author={Woo-Yeob Hyun and Dongsu Kang},
title={Generating Metamorphic Test Cases using 2-qubit Quantum Gate Combinations},
journal={Journal of The Korea Society of Computer and Information},
issn={1598-849X},
year={2026},
volume={31},
number={5},
pages={1-9}
TY - JOUR
AU - Woo-Yeob Hyun
AU - Dongsu Kang
TI - Generating Metamorphic Test Cases using 2-qubit Quantum Gate Combinations
JO - Journal of The Korea Society of Computer and Information
PY - 2026
VL - 31
IS - 5
PB - The Korean Society Of Computer And Information
SP - 1
EP - 9
SN - 1598-849X
AB - In quantum computing, the output probability distribution may vary with each execution of the same circuit due to its sensitivity to noise. In this study, 2-qubit quantum gate combinations that are expected to produce identical output distributions under ideal conditions are designed as metamorphic test cases, and Depolarizing, Amplitude Damping, and Phase Damping noise models are applied to analyze the effect of each noise type on the output probability distribution. Experimental results show that in all noise models, when the noise probability reached 0.01, the p-value dropped below the significance level, causing the collapse of the defined metamorphic relation. It was also quantitatively confirmed through KL-Divergence and Cosine Similarity that the divergence from the expected output distribution accumulates with increasing noise strength. When applying metamorphic testing to quantum gate combinations, quantum gate testing can be performed by verifying the feasibility of metamorphic relation judgment and quantitatively tracking the process using the three proposed metrics. The results of this study can be applied to quantum computing reliability evaluation and noise-tolerant circuit design, and present the potential as a versatile quantum software testing methodology.
KW - Quantum Computing;Noise Model;Quantum Gate Combination;Metamorphic Testing;Metamorphic Relation
DO -
UR -
ER -
Woo-Yeob Hyun and Dongsu Kang. (2026). Generating Metamorphic Test Cases using 2-qubit Quantum Gate Combinations. Journal of The Korea Society of Computer and Information, 31(5), 1-9.
Woo-Yeob Hyun and Dongsu Kang. 2026, "Generating Metamorphic Test Cases using 2-qubit Quantum Gate Combinations", Journal of The Korea Society of Computer and Information, vol.31, no.5 pp.1-9.
Woo-Yeob Hyun, Dongsu Kang "Generating Metamorphic Test Cases using 2-qubit Quantum Gate Combinations" Journal of The Korea Society of Computer and Information 31.5 pp.1-9 (2026) : 1.
Woo-Yeob Hyun, Dongsu Kang. Generating Metamorphic Test Cases using 2-qubit Quantum Gate Combinations. 2026; 31(5), 1-9.
Woo-Yeob Hyun and Dongsu Kang. "Generating Metamorphic Test Cases using 2-qubit Quantum Gate Combinations" Journal of The Korea Society of Computer and Information 31, no.5 (2026) : 1-9.
Woo-Yeob Hyun; Dongsu Kang. Generating Metamorphic Test Cases using 2-qubit Quantum Gate Combinations. Journal of The Korea Society of Computer and Information, 31(5), 1-9.
Woo-Yeob Hyun; Dongsu Kang. Generating Metamorphic Test Cases using 2-qubit Quantum Gate Combinations. Journal of The Korea Society of Computer and Information. 2026; 31(5) 1-9.
Woo-Yeob Hyun, Dongsu Kang. Generating Metamorphic Test Cases using 2-qubit Quantum Gate Combinations. 2026; 31(5), 1-9.
Woo-Yeob Hyun and Dongsu Kang. "Generating Metamorphic Test Cases using 2-qubit Quantum Gate Combinations" Journal of The Korea Society of Computer and Information 31, no.5 (2026) : 1-9.
