Rutile single crystals grown by skull melting method were cut paralel and perpendicular to growth axis, and bothsides of the cut wafers (5.5 m×1.0 m) were then polished to be miror surfaces. The black wafers were changed into paleyellow color by annealing in air at 1200 and 1300oC for 3~15 and 10~50 hours, respectively. After annealing, structural and(XRD), FT-IR transmittance spectra, laser Raman spectroscopy (LRS), photoluminescence (PL) and X-ray photoelectronspectroscopy (XPS). These results are analyzed increase of weight in air, decrease of weight in water and specific gravity,shown secondary phase of needle shape, diffusion of oxygen ion and increase of Ti3+. From the above results, we suggest thatthe skull melting method grown rutile single crystals contain defect centers such as Ov,-Ti3+, Ov-Ti3+ interstitials and F+-H+.Key words Rutile, Ov,-Ti3+, Ov-Ti3+ interstitial, F+-H+Skull melting.. .. ... rutile ... .....†.. ........ ..... , .. , 520-714......... , .. , 133-791(2006. 7. 3. .. )(2006. 8. 8. .... )