@article{ART001189569},
author={Tae-YoungLim and Chang-YeoulKim and Kwang-BoShim and Keun-HoAuh},
title={Characterization of transparent Sb-doped SnO2 conducting films by XPS analysis},
journal={Journal of the Korean Crystal Growth and Crystal Technology},
issn={1225-1429},
year={2003},
volume={13},
number={5},
pages={254-259}
TY - JOUR
AU - Tae-YoungLim
AU - Chang-YeoulKim
AU - Kwang-BoShim
AU - Keun-HoAuh
TI - Characterization of transparent Sb-doped SnO2 conducting films by XPS analysis
JO - Journal of the Korean Crystal Growth and Crystal Technology
PY - 2003
VL - 13
IS - 5
PB - The Korea Association Of Crystal Growth, Inc.
SP - 254
EP - 259
SN - 1225-1429
AB -
KW -
DO -
UR -
ER -
Tae-YoungLim, Chang-YeoulKim, Kwang-BoShim and Keun-HoAuh. (2003). Characterization of transparent Sb-doped SnO2 conducting films by XPS analysis. Journal of the Korean Crystal Growth and Crystal Technology, 13(5), 254-259.
Tae-YoungLim, Chang-YeoulKim, Kwang-BoShim and Keun-HoAuh. 2003, "Characterization of transparent Sb-doped SnO2 conducting films by XPS analysis", Journal of the Korean Crystal Growth and Crystal Technology, vol.13, no.5 pp.254-259.
Tae-YoungLim, Chang-YeoulKim, Kwang-BoShim, Keun-HoAuh "Characterization of transparent Sb-doped SnO2 conducting films by XPS analysis" Journal of the Korean Crystal Growth and Crystal Technology 13.5 pp.254-259 (2003) : 254.
Tae-YoungLim, Chang-YeoulKim, Kwang-BoShim, Keun-HoAuh. Characterization of transparent Sb-doped SnO2 conducting films by XPS analysis. 2003; 13(5), 254-259.
Tae-YoungLim, Chang-YeoulKim, Kwang-BoShim and Keun-HoAuh. "Characterization of transparent Sb-doped SnO2 conducting films by XPS analysis" Journal of the Korean Crystal Growth and Crystal Technology 13, no.5 (2003) : 254-259.
Tae-YoungLim; Chang-YeoulKim; Kwang-BoShim; Keun-HoAuh. Characterization of transparent Sb-doped SnO2 conducting films by XPS analysis. Journal of the Korean Crystal Growth and Crystal Technology, 13(5), 254-259.
Tae-YoungLim; Chang-YeoulKim; Kwang-BoShim; Keun-HoAuh. Characterization of transparent Sb-doped SnO2 conducting films by XPS analysis. Journal of the Korean Crystal Growth and Crystal Technology. 2003; 13(5) 254-259.
Tae-YoungLim, Chang-YeoulKim, Kwang-BoShim, Keun-HoAuh. Characterization of transparent Sb-doped SnO2 conducting films by XPS analysis. 2003; 13(5), 254-259.
Tae-YoungLim, Chang-YeoulKim, Kwang-BoShim and Keun-HoAuh. "Characterization of transparent Sb-doped SnO2 conducting films by XPS analysis" Journal of the Korean Crystal Growth and Crystal Technology 13, no.5 (2003) : 254-259.
