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GaN epitaxy growth by low temperature HVPE on CoSi2 buffer/Si substrates

  • Journal of the Korean Crystal Growth and Crystal Technology
  • Abbr : J. Korean Cryst. Growth Cryst. Technol.
  • 2009, 19(4), pp.159-164
  • Publisher : The Korea Association Of Crystal Growth, Inc.
  • Research Area : Engineering > Materials Science and Engineering

Jun-Seok Ha 1 박종성 2 Song Ohsung 2 T.YAO 3 JIho Chang 4

1University of California Solid State Lighting and Energy Center
2서울시립대학교
3Tohoku University
4한국해양대학교

Accredited

ABSTRACT

We fabricated 40 nm-thick cobalt silicide (CoSi2) as a buffer layer, on p-type Si(100) and Si(111) substrates to investigate the possibility of GaN epitaxial growth on CoSi2/Si substrates. We deposited GaN using a HVPE (hydride vapor phase epitaxy) with two processes of process I (850 o C-12 minutes + 1080 o C-30 minutes) and process II (557 o C-5 minutes + 900 o C-5 minutes) on CoSi2/Si substrates. An optical microscopy, FE-SEM, AFM, and HR-XRD (high resolution X-ray diffractometer) were employed to determine the GaN epitaxy. In case of process I, it showed no GaN epitaxial growth. However, in process II, it showed that GaN epitaxial growth occurred. Especially, in process II, GaN layer showed selfaligned substrate separation from silicon substrate. Through XRD ω-scan of GaN <0002> direction, we confirmed that the combination of cobalt silicide and Si(100) as a buffer and HVPE at low temperature (process II) was helpful for GaN epitaxy growth.

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