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Improvement of uniformity in chemical vapor deposition of silicon carbide using CFD

  • Journal of the Korean Crystal Growth and Crystal Technology
  • Abbr : J. Korean Cryst. Growth Cryst. Technol.
  • 2014, 24(6), pp.242-245
  • DOI : 10.6111/JKCGCT.2014.24.6.242
  • Publisher : The Korea Association Of Crystal Growth, Inc.
  • Research Area : Engineering > Materials Science and Engineering

Jin-Won Seo 1 Jun-Woo Kim 2 Yoonsoo Han 1 Kyoon Choi 1 Jong-Heun Lee 3

1한국세라믹기술원
2한국세라믹기술원 이천분원
3고려대학교

Accredited

ABSTRACT

In order to increase the thickness uniformity in chemical vapor depositon of silicon carbide, we have carried outCFD studies for a CVD apparatus having a horizontally-rotated 3-stage susceptor. We deposited silicon carbide films of3C-SiC phase showing quite uniform thickness between stages but not uniform one in the stage. The cause of thisnonuniformity is thought to be originated from the high rotational speed. And the uniformity between stages can be furtherincreased with the 120osplit type nozzles from CFD results. Through the formation of silicon carbide film on graphitesubstrates we can make oxidation-resistant and dust-free graphite components with high hardness for the semiconductorapplications.

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