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@article{ART002136477},
author={Jang Bo Shim and Jin Ki Kang and Young Kuk Lee},
title={Analysis of surface defect in RE : YAG (RE = Nd 3+ , Er 3+ , Yb 3+ ) single crystal using chemical polishing and etching},
journal={Journal of the Korean Crystal Growth and Crystal Technology},
issn={1225-1429},
year={2016},
volume={26},
number={4},
pages={131-134},
doi={10.6111/JKCGCT.2016.26.4.131}

TY - JOUR
AU - Jang Bo Shim
AU - Jin Ki Kang
AU - Young Kuk Lee
TI - Analysis of surface defect in RE : YAG (RE = Nd 3+ , Er 3+ , Yb 3+ ) single crystal using chemical polishing and etching
JO - Journal of the Korean Crystal Growth and Crystal Technology
PY - 2016
VL - 26
IS - 4
PB - The Korea Association Of Crystal Growth, Inc.
SP - 131
EP - 134
SN - 1225-1429
AB - The conditions for chemical polishing and etching technique were investigated to reveal surface defects in RE : YAG (RE = Nd3+, Er3+, Yb3+) single crystals grown by Czochralski method. The optimal condition for chemical polishing was in 85 % H3PO4 solution at 330oC for 30 minutes with a specimen fixed in the vertical direction. In addition, the optimal condition for chemical etching was in 85 % H3PO4 solution at 260oC for 1 hour, and 70~80 μm sized triangular etch pits were observed on (111) face. As a result of defect density analysis, 1.9 × 103/cm2 for Nd(1 %) : YAG, 4.3 × 102/cm2 for Er(7.3 %) : YAG, and 5.1 × 102/cm2 for Yb(15 %) : YAG were measured.
KW - YAG;Chemical polishing;Chemical etching;Etch pit density
DO - 10.6111/JKCGCT.2016.26.4.131
ER -

Jang Bo Shim, Jin Ki Kang and Young Kuk Lee. (2016). Analysis of surface defect in RE : YAG (RE = Nd 3+ , Er 3+ , Yb 3+ ) single crystal using chemical polishing and etching. Journal of the Korean Crystal Growth and Crystal Technology, 26(4), 131-134.

Jang Bo Shim, Jin Ki Kang and Young Kuk Lee. 2016, "Analysis of surface defect in RE : YAG (RE = Nd 3+ , Er 3+ , Yb 3+ ) single crystal using chemical polishing and etching", Journal of the Korean Crystal Growth and Crystal Technology, vol.26, no.4 pp.131-134. Available from: doi:10.6111/JKCGCT.2016.26.4.131

Jang Bo Shim, Jin Ki Kang, Young Kuk Lee "Analysis of surface defect in RE : YAG (RE = Nd 3+ , Er 3+ , Yb 3+ ) single crystal using chemical polishing and etching" Journal of the Korean Crystal Growth and Crystal Technology 26.4 pp.131-134 (2016) : 131.

Jang Bo Shim, Jin Ki Kang, Young Kuk Lee. Analysis of surface defect in RE : YAG (RE = Nd 3+ , Er 3+ , Yb 3+ ) single crystal using chemical polishing and etching. 2016; 26(4), 131-134. Available from: doi:10.6111/JKCGCT.2016.26.4.131

Jang Bo Shim, Jin Ki Kang and Young Kuk Lee. "Analysis of surface defect in RE : YAG (RE = Nd 3+ , Er 3+ , Yb 3+ ) single crystal using chemical polishing and etching" Journal of the Korean Crystal Growth and Crystal Technology 26, no.4 (2016) : 131-134.doi: 10.6111/JKCGCT.2016.26.4.131

Jang Bo Shim; Jin Ki Kang; Young Kuk Lee. Analysis of surface defect in RE : YAG (RE = Nd 3+ , Er 3+ , Yb 3+ ) single crystal using chemical polishing and etching. Journal of the Korean Crystal Growth and Crystal Technology, 26(4), 131-134. doi: 10.6111/JKCGCT.2016.26.4.131

Jang Bo Shim; Jin Ki Kang; Young Kuk Lee. Analysis of surface defect in RE : YAG (RE = Nd 3+ , Er 3+ , Yb 3+ ) single crystal using chemical polishing and etching. Journal of the Korean Crystal Growth and Crystal Technology. 2016; 26(4) 131-134. doi: 10.6111/JKCGCT.2016.26.4.131

Jang Bo Shim, Jin Ki Kang, Young Kuk Lee. Analysis of surface defect in RE : YAG (RE = Nd 3+ , Er 3+ , Yb 3+ ) single crystal using chemical polishing and etching. 2016; 26(4), 131-134. Available from: doi:10.6111/JKCGCT.2016.26.4.131

Jang Bo Shim, Jin Ki Kang and Young Kuk Lee. "Analysis of surface defect in RE : YAG (RE = Nd 3+ , Er 3+ , Yb 3+ ) single crystal using chemical polishing and etching" Journal of the Korean Crystal Growth and Crystal Technology 26, no.4 (2016) : 131-134.doi: 10.6111/JKCGCT.2016.26.4.131