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HVPE growth of Mg-doped AlN epilayers for high-performance power-semi-conductor devices

  • Journal of the Korean Crystal Growth and Crystal Technology
  • Abbr : J. Korean Cryst. Growth Cryst. Technol.
  • 2017, 27(6), pp.275-281
  • DOI : 10.6111/JKCGCT.2017.27.6.275
  • Publisher : The Korea Association Of Crystal Growth, Inc.
  • Research Area : Engineering > Materials Science and Engineering
  • Published : December 31, 2017

Sunggeun Bae 1 Jeon Injun 1 Min Yang 1 Sam Nyung Yi ORD ID 1 Hyung Soo Ahn 1 Jeon Hunsoo 1 Kyoung Hwa Kim 1 Kim Suck Whan 2

1한국해양대학교
2안동대학교

Accredited

ABSTRACT

AlN is a promising material for wide band gap and high-frequency electronics device due to its wide bandgap and high thermal conductivity. AlN has advantages as materials for power semiconductors with a larger breakdown field, and a smaller specific on-resistance at high voltage. The growth of a p-type AlN epilayer with high conductivity is important for a manufacturing an AlN-based applications. In this paper, Mg doped AlN epilayers were grown by a mixed-source HVPE. Al and Mg mixture were used as source materials for the growth of Mg-doped AlN epilayers. Mg concentration in the AlN was controlled by modulating the quantity of Mg source in the mixed-source. Surface morphology and crystalline structure of AlN epilayers with different Mg concentrations were characterized by FE-SEM and HR-XRD. XPS spectra of the Mgdoped AlN epilayers demonstrated that Mg was doped successfully into the AlN epilayer by the mixed-source HVPE.

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This paper was written with support from the National Research Foundation of Korea.