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Characterization of alpha-Ga2O3 epilayers grown on cone-shape patterned sapphire substrate by halide vapor phase epitaxy

  • Journal of the Korean Crystal Growth and Crystal Technology
  • Abbr : J. Korean Cryst. Growth Cryst. Technol.
  • 2019, 29(4), pp.173-178
  • DOI : 10.6111/JKCGCT.2019.29.4.173
  • Publisher : The Korea Association Of Crystal Growth, Inc.
  • Research Area : Engineering > Materials Science and Engineering
  • Received : July 29, 2019
  • Accepted : August 12, 2019
  • Published : August 31, 2019

Hoki Son 1 Ye-ji Choi 1 Young-Jin Lee 1 Jinho Kim 1 Sun Woog Kim ORD ID 1 Yong-Ho Ra 1 Tae-Young Lim 1 Jonghee Hwang 1 Dae-Woo Jeon 1

1한국세라믹기술원

Accredited

ABSTRACT

In this study, we demonstrated a characterization of α-Ga2O3 grown on a cone-shape patterned sapphire substrate by using the halide vapor phase epitaxy. An α-Ga2O3 was grown on different size of PSS and c-plane sapphire substrate for comparison to confirm the effect of PSS. In addition, growth time of α-Ga2O3 was gradually increased to confirm growth mechanism of α-Ga2O3 grown on the PSS. A growth temperature was changed to 470-550°C. It can be analyzed growth conditions and mechanisms on the cone-shape PSS, resulting in a significant decrease in the FWHM value of an asymmetric plane (10-14) of α-Ga2O3 , due to lateral growth that occurs during the growth process.

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