@article{ART002497278},
author={Hoki Son and Ye-ji Choi and Young-Jin Lee and Jinho Kim and Sun Woog Kim and Yong-Ho Ra and Tae-Young Lim and Jonghee Hwang and Dae-Woo Jeon},
title={Characterization of alpha-Ga2O3 epilayers grown on cone-shape patterned sapphire substrate by halide vapor phase epitaxy},
journal={Journal of the Korean Crystal Growth and Crystal Technology},
issn={1225-1429},
year={2019},
volume={29},
number={4},
pages={173-178},
doi={10.6111/JKCGCT.2019.29.4.173}
TY - JOUR
AU - Hoki Son
AU - Ye-ji Choi
AU - Young-Jin Lee
AU - Jinho Kim
AU - Sun Woog Kim
AU - Yong-Ho Ra
AU - Tae-Young Lim
AU - Jonghee Hwang
AU - Dae-Woo Jeon
TI - Characterization of alpha-Ga2O3 epilayers grown on cone-shape patterned sapphire substrate by halide vapor phase epitaxy
JO - Journal of the Korean Crystal Growth and Crystal Technology
PY - 2019
VL - 29
IS - 4
PB - The Korea Association Of Crystal Growth, Inc.
SP - 173
EP - 178
SN - 1225-1429
AB - In this study, we demonstrated a characterization of α-Ga2O3 grown on a cone-shape patterned sapphire substrate by using the halide vapor phase epitaxy. An α-Ga2O3 was grown on different size of PSS and c-plane sapphire substrate for comparison to confirm the effect of PSS. In addition, growth time of α-Ga2O3 was gradually increased to confirm growth mechanism of α-Ga2O3 grown on the PSS. A growth temperature was changed to 470-550°C. It can be analyzed growth conditions and mechanisms on the cone-shape PSS, resulting in a significant decrease in the FWHM value of an asymmetric plane (10-14) of α-Ga2O3 , due to lateral growth that occurs during the growth process.
KW - α-Ga 2 O 3;HVPE;PSS;Refractive index
DO - 10.6111/JKCGCT.2019.29.4.173
ER -
Hoki Son, Ye-ji Choi, Young-Jin Lee, Jinho Kim, Sun Woog Kim, Yong-Ho Ra, Tae-Young Lim, Jonghee Hwang and Dae-Woo Jeon. (2019). Characterization of alpha-Ga2O3 epilayers grown on cone-shape patterned sapphire substrate by halide vapor phase epitaxy. Journal of the Korean Crystal Growth and Crystal Technology, 29(4), 173-178.
Hoki Son, Ye-ji Choi, Young-Jin Lee, Jinho Kim, Sun Woog Kim, Yong-Ho Ra, Tae-Young Lim, Jonghee Hwang and Dae-Woo Jeon. 2019, "Characterization of alpha-Ga2O3 epilayers grown on cone-shape patterned sapphire substrate by halide vapor phase epitaxy", Journal of the Korean Crystal Growth and Crystal Technology, vol.29, no.4 pp.173-178. Available from: doi:10.6111/JKCGCT.2019.29.4.173
Hoki Son, Ye-ji Choi, Young-Jin Lee, Jinho Kim, Sun Woog Kim, Yong-Ho Ra, Tae-Young Lim, Jonghee Hwang, Dae-Woo Jeon "Characterization of alpha-Ga2O3 epilayers grown on cone-shape patterned sapphire substrate by halide vapor phase epitaxy" Journal of the Korean Crystal Growth and Crystal Technology 29.4 pp.173-178 (2019) : 173.
Hoki Son, Ye-ji Choi, Young-Jin Lee, Jinho Kim, Sun Woog Kim, Yong-Ho Ra, Tae-Young Lim, Jonghee Hwang, Dae-Woo Jeon. Characterization of alpha-Ga2O3 epilayers grown on cone-shape patterned sapphire substrate by halide vapor phase epitaxy. 2019; 29(4), 173-178. Available from: doi:10.6111/JKCGCT.2019.29.4.173
Hoki Son, Ye-ji Choi, Young-Jin Lee, Jinho Kim, Sun Woog Kim, Yong-Ho Ra, Tae-Young Lim, Jonghee Hwang and Dae-Woo Jeon. "Characterization of alpha-Ga2O3 epilayers grown on cone-shape patterned sapphire substrate by halide vapor phase epitaxy" Journal of the Korean Crystal Growth and Crystal Technology 29, no.4 (2019) : 173-178.doi: 10.6111/JKCGCT.2019.29.4.173
Hoki Son; Ye-ji Choi; Young-Jin Lee; Jinho Kim; Sun Woog Kim; Yong-Ho Ra; Tae-Young Lim; Jonghee Hwang; Dae-Woo Jeon. Characterization of alpha-Ga2O3 epilayers grown on cone-shape patterned sapphire substrate by halide vapor phase epitaxy. Journal of the Korean Crystal Growth and Crystal Technology, 29(4), 173-178. doi: 10.6111/JKCGCT.2019.29.4.173
Hoki Son; Ye-ji Choi; Young-Jin Lee; Jinho Kim; Sun Woog Kim; Yong-Ho Ra; Tae-Young Lim; Jonghee Hwang; Dae-Woo Jeon. Characterization of alpha-Ga2O3 epilayers grown on cone-shape patterned sapphire substrate by halide vapor phase epitaxy. Journal of the Korean Crystal Growth and Crystal Technology. 2019; 29(4) 173-178. doi: 10.6111/JKCGCT.2019.29.4.173
Hoki Son, Ye-ji Choi, Young-Jin Lee, Jinho Kim, Sun Woog Kim, Yong-Ho Ra, Tae-Young Lim, Jonghee Hwang, Dae-Woo Jeon. Characterization of alpha-Ga2O3 epilayers grown on cone-shape patterned sapphire substrate by halide vapor phase epitaxy. 2019; 29(4), 173-178. Available from: doi:10.6111/JKCGCT.2019.29.4.173
Hoki Son, Ye-ji Choi, Young-Jin Lee, Jinho Kim, Sun Woog Kim, Yong-Ho Ra, Tae-Young Lim, Jonghee Hwang and Dae-Woo Jeon. "Characterization of alpha-Ga2O3 epilayers grown on cone-shape patterned sapphire substrate by halide vapor phase epitaxy" Journal of the Korean Crystal Growth and Crystal Technology 29, no.4 (2019) : 173-178.doi: 10.6111/JKCGCT.2019.29.4.173