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A study on the change of N/Al ratio in the growth of thick AlN single crystal layer using HVPE (Hydride Vapor Phase Epitaxy) method

  • Journal of the Korean Crystal Growth and Crystal Technology
  • Abbr : J. Korean Cryst. Growth Cryst. Technol.
  • 2025, 35(3), pp.101~104
  • DOI : 10.6111/JKCGCT.2025.35.3.101
  • Publisher : The Korea Association Of Crystal Growth, Inc.
  • Research Area : Engineering > Materials Science and Engineering
  • Received : September 8, 2025
  • Accepted : September 12, 2025
  • Published : September 30, 2025

Kang, Seung-Min 1

1한서대학교

Accredited

ABSTRACT

In order to grow AlN single crystals, HVPE (hydride vapor phase epitaxy) method was used and the sapphire substrates were adapted to the seed for the growth of single crystal AlN. The nitrogen gas, the carrier gas, was used to supply the HCl gas and NH3 and to keep the flow in the reactor. This redearch was carried out in order to evaluate the growth behavior of AlN crystal growth due to the change of the V/III gas ratio. By fixing the amount of nitrogen carrier gas, which is supplied during growth, there was a change in the grown crystal phase depending on the change in the supply ratio of nitrogen (N) and aluminum (Al). The grown AlN thick films had the variation result along the change of the V/III gas ratio. The growth behavior of AlN crystal was characterized by observation using an optical microscope and SEM, and the results are discussed and reported.

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