@article{ART001753915},
author={Sang-Chul Kim},
title={Semiconductor Etching Process Monitoring System Development using OES Sensor},
journal={Journal of The Korea Society of Computer and Information},
issn={1598-849X},
year={2013},
volume={18},
number={3},
pages={107-118}
TY - JOUR
AU - Sang-Chul Kim
TI - Semiconductor Etching Process Monitoring System Development using OES Sensor
JO - Journal of The Korea Society of Computer and Information
PY - 2013
VL - 18
IS - 3
PB - The Korean Society Of Computer And Information
SP - 107
EP - 118
SN - 1598-849X
AB - In this paper, we developed the semiconductor monitoring system for the etching process.Around the world, expert companies are competing fiercely since the semiconductor industry is a leading value-added industry that produces the essential components of electronic products. As a result, many researches have been conducted in order to improve the quality, productivity, and characteristics of semiconductor products. Process monitoring techniques has an important role to give an equivalent quality and productivity to produce semiconductor. In fact, since the etching process to form a semiconductor circuit causes great damage to the semiconductors, it is very necessary to develop a system for monitoring the process. The proposed monitoring system is mainly focused on the dry etching process using plasma and it provides the detailed observation,analysis and feedback to managers. It has the functionality of setting scenarios to match the process control automatically. In addition, it maximizes the efficiency of process automation. The result can be immediately reflected to the system since it performs real-time monitoring. UI (User Interface) provides managers with diagnosis of the current state in the process. The monitoring system has diverse functionalities to control the process according to the scenario written in advance, to stop the process efficiently and finally to increase production efficiency.
KW - Semiconductor;Etching;Faulty Check;Plasma;Optical Emission Spectroscopy Sensor;Monitoring
DO -
UR -
ER -
Sang-Chul Kim. (2013). Semiconductor Etching Process Monitoring System Development using OES Sensor. Journal of The Korea Society of Computer and Information, 18(3), 107-118.
Sang-Chul Kim. 2013, "Semiconductor Etching Process Monitoring System Development using OES Sensor", Journal of The Korea Society of Computer and Information, vol.18, no.3 pp.107-118.
Sang-Chul Kim "Semiconductor Etching Process Monitoring System Development using OES Sensor" Journal of The Korea Society of Computer and Information 18.3 pp.107-118 (2013) : 107.
Sang-Chul Kim. Semiconductor Etching Process Monitoring System Development using OES Sensor. 2013; 18(3), 107-118.
Sang-Chul Kim. "Semiconductor Etching Process Monitoring System Development using OES Sensor" Journal of The Korea Society of Computer and Information 18, no.3 (2013) : 107-118.
Sang-Chul Kim. Semiconductor Etching Process Monitoring System Development using OES Sensor. Journal of The Korea Society of Computer and Information, 18(3), 107-118.
Sang-Chul Kim. Semiconductor Etching Process Monitoring System Development using OES Sensor. Journal of The Korea Society of Computer and Information. 2013; 18(3) 107-118.
Sang-Chul Kim. Semiconductor Etching Process Monitoring System Development using OES Sensor. 2013; 18(3), 107-118.
Sang-Chul Kim. "Semiconductor Etching Process Monitoring System Development using OES Sensor" Journal of The Korea Society of Computer and Information 18, no.3 (2013) : 107-118.
