KJCKorea
Journal Central

@article{ART002406748},
author={Yushin Chang},
title={Verification for the design limit margin of the power device using the HALT reliability test},
journal={Journal of The Korea Society of Computer and Information},
issn={1598-849X},
year={2018},
volume={23},
number={11},
pages={67-74},
doi={10.9708/jksci.2018.23.11.067}

TY - JOUR
AU - Yushin Chang
TI - Verification for the design limit margin of the power device using the HALT reliability test
JO - Journal of The Korea Society of Computer and Information
PY - 2018
VL - 23
IS - 11
PB - The Korean Society Of Computer And Information
SP - 67
EP - 74
SN - 1598-849X
AB - The verification for the design limit margin of the power device for the information communication and surveillance systems using HALT(Highly Accelerated Life Test) reliability test is described. The HALT reliability test performs with a step stress method which change condition until the marginal step in a design and development phase. The HALT test methods are the low temperature(cold) step stress test, the high temperature(hot) step stress test, the thermal shock cyclic stess test, and the high temperature destruct limit(hot DL) step stress test. The power device is checked the operating performance during the test. In this paper, the HALT was performed to find out the design limit margin of the power device.
KW - HALT(Highly Accelerated Life Test);Reliability test;Power device;Design limit margin
DO - 10.9708/jksci.2018.23.11.067
ER -

Yushin Chang. (2018). Verification for the design limit margin of the power device using the HALT reliability test. Journal of The Korea Society of Computer and Information, 23(11), 67-74.

Yushin Chang. 2018, "Verification for the design limit margin of the power device using the HALT reliability test", Journal of The Korea Society of Computer and Information, vol.23, no.11 pp.67-74. Available from: doi:10.9708/jksci.2018.23.11.067

Yushin Chang "Verification for the design limit margin of the power device using the HALT reliability test" Journal of The Korea Society of Computer and Information 23.11 pp.67-74 (2018) : 67.

Yushin Chang. Verification for the design limit margin of the power device using the HALT reliability test. 2018; 23(11), 67-74. Available from: doi:10.9708/jksci.2018.23.11.067

Yushin Chang. "Verification for the design limit margin of the power device using the HALT reliability test" Journal of The Korea Society of Computer and Information 23, no.11 (2018) : 67-74.doi: 10.9708/jksci.2018.23.11.067

Yushin Chang. Verification for the design limit margin of the power device using the HALT reliability test. Journal of The Korea Society of Computer and Information, 23(11), 67-74. doi: 10.9708/jksci.2018.23.11.067

Yushin Chang. Verification for the design limit margin of the power device using the HALT reliability test. Journal of The Korea Society of Computer and Information. 2018; 23(11) 67-74. doi: 10.9708/jksci.2018.23.11.067

Yushin Chang. Verification for the design limit margin of the power device using the HALT reliability test. 2018; 23(11), 67-74. Available from: doi:10.9708/jksci.2018.23.11.067

Yushin Chang. "Verification for the design limit margin of the power device using the HALT reliability test" Journal of The Korea Society of Computer and Information 23, no.11 (2018) : 67-74.doi: 10.9708/jksci.2018.23.11.067