Designing a quality inspection system using Deep SVDD 1) (Deep SVDD 알고리즘 기반의 품질 검사 시스템 설계)

Jungjun Kim (김정준); Sung-Chul Jee (지성철); Seungwoo Kim (김승우); JeonKwangWoo (전광우); Jeon-Sung Kang (강전성); Hyun-Joon Chung (정현준)

doi:10.9708/jksci.2023.28.11.021

Designing a quality inspection system using Deep SVDD 1)

Journal of The Korea Society of Computer and Information
Abbr : JKSCI
2023, 28(11), pp.21-28
DOI : 10.9708/jksci.2023.28.11.021
Publisher : The Korean Society Of Computer And Information
Research Area : Engineering > Computer Science
Received : October 18, 2023
Accepted : November 9, 2023
Published : November 30, 2023

Jungjun Kim ¹, Sung-Chul Jee ¹, Seungwoo Kim ¹, JeonKwangWoo ¹, Jeon-Sung Kang ¹, Hyun-Joon Chung ¹

¹한국로봇융합연구원

Accredited

ABSTRACT

In manufacturing companies that focus on small-scale production of multiple product varieties, defective products are manually selected by workers rather than relying on automated inspection. Consequently, there is a higher risk of incorrect sorting due to variations in selection criteria based on the workers' experience and expertise, without consistent standards. Moreover, for non-standardized flexible objects with varying sizes and shapes, there can be even greater deviations in the selection criteria. To address these issues, this paper designs a quality inspection system using artificial intelligence-based unsupervised learning methods and conducts research by experimenting with accuracy using a dataset obtained from real manufacturing environments.

KEYWORDS

Anomaly Detection, Quality Inspection, Image Processing, Unsupervised Learning, Deep SVDD

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* References for papers published after 2023 are currently being built.

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This paper was written with support from the National Research Foundation of Korea.

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Journal of The Korea Society of Computer and Information 2023 KCI Impact Factor : 0.65

Designing a quality inspection system using Deep SVDD 1)

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* References for papers published after 2023 are currently being built.

Journal of The Korea Society of Computer and Information 2023 KCI Impact Factor : 0.65

Designing a quality inspection system using Deep SVDD 1)

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* References for papers published after 2023 are currently being built.