Filed Programmable Logic Control and Test Pattern Generation for IoT Multiple Object switch Control

KIM EUNG JU (김응주); Jung Ji-Hak (정지학)

Filed Programmable Logic Control and Test Pattern Generation for IoT Multiple Object switch Control

Journal of Internet of Things and Convergence
Abbr : JKIOTS
2020, 6(1), pp.97-102
Publisher : The Korea Internet of Things Society
Research Area : Engineering > Computer Science > Internet Information Processing
Received : December 21, 2019
Accepted : January 29, 2020
Published : March 31, 2020

KIM EUNG JU ¹, Jung Ji-Hak ¹

¹한국폴리텍대학

Candidate

ABSTRACT

Multi-Channel Switch ICs for IoT have integrated several solid state structure low ON-resistance bi-directional relay MOS switches with level shifter to drive high voltage and they should be independently controlled by external serialized logic control. These devices are designed for using in applications requiring high-voltage switching control by low-voltage control signals, such as medical ultra-sound imaging, ink-jet printer control, bare board open/short and leakage test system using Kelvin 4-terminal measurement method. This paper describes implementation of analog switch control block and its verification using Field programmable Gate Array (FPGA) test pattern generation. Each block has been implemented using Verilog hardware description language then simulated by Modelsim and prototyped in a FPGA board. Compare to conventional IC, The proposed architecture can be applied to fields where multiple entities need to be controlled simultaneously in the IoT environment and the proposed pattern generation method can be applied to test similar types of ICs.

KEYWORDS

Multi-Channel switch IC, IoT, ON-resistance, shift register, Serialized logic, latch, FPGA

Citation status

* References for papers published after 2023 are currently being built.

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Journal of Internet of Things and Convergence 2023 KCI Impact Factor : 0.89