본문 바로가기
  • Home

Filed Programmable Logic Control and Test Pattern Generation for IoT Multiple Object switch Control

  • Journal of Internet of Things and Convergence
  • Abbr : JKIOTS
  • 2020, 6(1), pp.97-102
  • Publisher : The Korea Internet of Things Society
  • Research Area : Engineering > Computer Science > Internet Information Processing
  • Received : December 21, 2019
  • Accepted : January 29, 2020
  • Published : March 31, 2020

KIM EUNG JU 1 Jung Ji-Hak 1

1한국폴리텍대학

Candidate

ABSTRACT

Multi-Channel Switch ICs for IoT have integrated several solid state structure low ON-resistance bi-directional relay MOS switches with level shifter to drive high voltage and they should be independently controlled by external serialized logic control. These devices are designed for using in applications requiring high-voltage switching control by low-voltage control signals, such as medical ultra-sound imaging, ink-jet printer control, bare board open/short and leakage test system using Kelvin 4-terminal measurement method. This paper describes implementation of analog switch control block and its verification using Field programmable Gate Array (FPGA) test pattern generation. Each block has been implemented using Verilog hardware description language then simulated by Modelsim and prototyped in a FPGA board. Compare to conventional IC, The proposed architecture can be applied to fields where multiple entities need to be controlled simultaneously in the IoT environment and the proposed pattern generation method can be applied to test similar types of ICs.

Citation status

* References for papers published after 2022 are currently being built.