본문 바로가기
  • Home

A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory

  • Journal of Internet of Things and Convergence
  • Abbr : JKIOTS
  • 2021, 7(4), pp.9-14
  • DOI : 10.20465/KIOTS.2021.7.4.009
  • Publisher : The Korea Internet of Things Society
  • Research Area : Engineering > Computer Science > Internet Information Processing
  • Received : August 26, 2021
  • Accepted : October 16, 2021
  • Published : December 31, 2021

Hyun-Seob Lee 1

1백석대학교

Accredited

ABSTRACT

In computing systems that require high reliability, the method of predicting the lifetime of a storage device is one of the important factors for system management because it can maximize usability as well as data protection. The life of a solid state drive (SSD) that has recently been used as a storage device in several storage systems is linked to the life of the NAND flash memory that constitutes it. Therefore, in a storage system configured using an SSD, a method of accurately and efficiently predicting the lifespan of a NAND flash memory is required. In this paper, a method for optimizing the lifetime prediction of a flash memory-based storage device using the frequency of NAND flash memory failure is proposed. For this, we design a cost matrix to collect the frequency of defects that occur when processing data in units of Drive Writes Per Day (DWPD). In addition, a method of predicting the remaining cost to the slope where the life-long finish occurs using the Gradient Descent method is proposed. Finally, we proved the excellence of the proposed idea when any defect occurs with simulation.

Citation status

* References for papers published after 2023 are currently being built.