@article{ART002796533},
author={Hyun-Seob Lee},
title={A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory},
journal={Journal of Internet of Things and Convergence},
issn={2466-0078},
year={2021},
volume={7},
number={4},
pages={9-14},
doi={10.20465/KIOTS.2021.7.4.009}
TY - JOUR
AU - Hyun-Seob Lee
TI - A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory
JO - Journal of Internet of Things and Convergence
PY - 2021
VL - 7
IS - 4
PB - The Korea Internet of Things Society
SP - 9
EP - 14
SN - 2466-0078
AB - In computing systems that require high reliability, the method of predicting the lifetime of a storage device is one of the important factors for system management because it can maximize usability as well as data protection. The life of a solid state drive (SSD) that has recently been used as a storage device in several storage systems is linked to the life of the NAND flash memory that constitutes it. Therefore, in a storage system configured using an SSD, a method of accurately and efficiently predicting the lifespan of a NAND flash memory is required. In this paper, a method for optimizing the lifetime prediction of a flash memory-based storage device using the frequency of NAND flash memory failure is proposed. For this, we design a cost matrix to collect the frequency of defects that occur when processing data in units of Drive Writes Per Day (DWPD). In addition, a method of predicting the remaining cost to the slope where the life-long finish occurs using the Gradient Descent method is proposed. Finally, we proved the excellence of the proposed idea when any defect occurs with simulation.
KW - Nand flash memory;Prediction of occurrence of deffects;Optimizing lifetime prediction.;Storage system;Big data analysis
DO - 10.20465/KIOTS.2021.7.4.009
ER -
Hyun-Seob Lee. (2021). A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory. Journal of Internet of Things and Convergence, 7(4), 9-14.
Hyun-Seob Lee. 2021, "A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory", Journal of Internet of Things and Convergence, vol.7, no.4 pp.9-14. Available from: doi:10.20465/KIOTS.2021.7.4.009
Hyun-Seob Lee "A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory" Journal of Internet of Things and Convergence 7.4 pp.9-14 (2021) : 9.
Hyun-Seob Lee. A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory. 2021; 7(4), 9-14. Available from: doi:10.20465/KIOTS.2021.7.4.009
Hyun-Seob Lee. "A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory" Journal of Internet of Things and Convergence 7, no.4 (2021) : 9-14.doi: 10.20465/KIOTS.2021.7.4.009
Hyun-Seob Lee. A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory. Journal of Internet of Things and Convergence, 7(4), 9-14. doi: 10.20465/KIOTS.2021.7.4.009
Hyun-Seob Lee. A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory. Journal of Internet of Things and Convergence. 2021; 7(4) 9-14. doi: 10.20465/KIOTS.2021.7.4.009
Hyun-Seob Lee. A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory. 2021; 7(4), 9-14. Available from: doi:10.20465/KIOTS.2021.7.4.009
Hyun-Seob Lee. "A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory" Journal of Internet of Things and Convergence 7, no.4 (2021) : 9-14.doi: 10.20465/KIOTS.2021.7.4.009
