@article{ART001112945},
author={KIM YOUNG KWAN and 김대일},
title={Utilization of the surface damage as gettering sink in the silicon wafers useful for the solar cell fabrication},
journal={Journal of the Korean Crystal Growth and Crystal Technology},
issn={1225-1429},
year={2006},
volume={16},
number={2},
pages={66-70}
TY - JOUR
AU - KIM YOUNG KWAN
AU - 김대일
TI - Utilization of the surface damage as gettering sink in the silicon wafers useful for the solar cell fabrication
JO - Journal of the Korean Crystal Growth and Crystal Technology
PY - 2006
VL - 16
IS - 2
PB - The Korea Association Of Crystal Growth, Inc.
SP - 66
EP - 70
SN - 1225-1429
AB - Various kind of structural defects are observed to be present on the oxidized surface of the silicon crystal whichwas previously damaged mechanicaly. The formation of such defects was found to depend on the amount of damageinduced and the temperature of thermal oxidation. It was confirmed by the measurement of minority carrier life time thatof damage or lower oxidation temperature believed to has higher capability of getering over defects like dislocation lopsor stacking faults.Key words Defects, Strained layer, Silicon crystal, Gettering
KW - Defects;Strained layer;Silicon crystal;Gettering
DO -
UR -
ER -
KIM YOUNG KWAN and 김대일. (2006). Utilization of the surface damage as gettering sink in the silicon wafers useful for the solar cell fabrication. Journal of the Korean Crystal Growth and Crystal Technology, 16(2), 66-70.
KIM YOUNG KWAN and 김대일. 2006, "Utilization of the surface damage as gettering sink in the silicon wafers useful for the solar cell fabrication", Journal of the Korean Crystal Growth and Crystal Technology, vol.16, no.2 pp.66-70.
KIM YOUNG KWAN, 김대일 "Utilization of the surface damage as gettering sink in the silicon wafers useful for the solar cell fabrication" Journal of the Korean Crystal Growth and Crystal Technology 16.2 pp.66-70 (2006) : 66.
KIM YOUNG KWAN, 김대일. Utilization of the surface damage as gettering sink in the silicon wafers useful for the solar cell fabrication. 2006; 16(2), 66-70.
KIM YOUNG KWAN and 김대일. "Utilization of the surface damage as gettering sink in the silicon wafers useful for the solar cell fabrication" Journal of the Korean Crystal Growth and Crystal Technology 16, no.2 (2006) : 66-70.
KIM YOUNG KWAN; 김대일. Utilization of the surface damage as gettering sink in the silicon wafers useful for the solar cell fabrication. Journal of the Korean Crystal Growth and Crystal Technology, 16(2), 66-70.
KIM YOUNG KWAN; 김대일. Utilization of the surface damage as gettering sink in the silicon wafers useful for the solar cell fabrication. Journal of the Korean Crystal Growth and Crystal Technology. 2006; 16(2) 66-70.
KIM YOUNG KWAN, 김대일. Utilization of the surface damage as gettering sink in the silicon wafers useful for the solar cell fabrication. 2006; 16(2), 66-70.
KIM YOUNG KWAN and 김대일. "Utilization of the surface damage as gettering sink in the silicon wafers useful for the solar cell fabrication" Journal of the Korean Crystal Growth and Crystal Technology 16, no.2 (2006) : 66-70.
