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Defect analysis of calcium fluoride single crystal substrates with (100) and (111) orientation

  • Journal of the Korean Crystal Growth and Crystal Technology
  • Abbr : J. Korean Cryst. Growth Cryst. Technol.
  • 2024, 34(1), pp.8-15
  • DOI : 10.6111/JKCGCT.2024.34.1.008
  • Publisher : The Korea Association Of Crystal Growth, Inc.
  • Research Area : Engineering > Materials Science and Engineering
  • Received : January 26, 2024
  • Accepted : February 13, 2024
  • Published : February 29, 2024

Ye-Jin Choi 1 Min-Gyu Kang 1 Gi-Uk Lee 1 Mi-Seon Park 1 Gwang-Hee Jung 1 Hea-Kyun Jung 2 Doo-Gun Kim 3 Lee, Won Jae 1

1동의대학교
2(주)셀릭
3한국광기술원

Accredited

ABSTRACT

The CaF2 single crystal has notable characteristics such as a large band gap (12 eV), excellent transparency over a wide wavelength range, low refractive index and dispersion. Due to these outstanding properties, CaF2 single crystal has considered as a promising material for short-wavelength light sources in recent lithography processes. However, there is an inherent birefringence of the material at 157 nm and the resulting aberration can be compensated for through the combination of the (100) plane and the (111) plane. Therefore, it is necessary to investigate the characteristics according to the plane. In thisstudy, we analyzed crystallinity, optical properties of commercial CaF2 single crystal wafers grown by the Czochralski method. In particular, through chemical etching under various conditions, it was confirmed that the shape of etch pits appears differently depending on the plane and the shape and array of specific etch pits affected by dislocations and defects were examined.

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